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Method for measuring specific location with excessive EMC problems in product

A technology for specific locations and products, applied in measuring devices, measuring interference from external sources, measuring electricity and other directions, and can solve problems such as inability to accurately locate radiation sources.

Inactive Publication Date: 2018-02-16
深圳市科卫泰实业发展有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] For this reason, the purpose of the present invention is to provide a method for measuring the specific location of the product EMC problem, to solve the problem that the existing detection method cannot accurately locate the radiation source

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  • Method for measuring specific location with excessive EMC problems in product
  • Method for measuring specific location with excessive EMC problems in product
  • Method for measuring specific location with excessive EMC problems in product

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Embodiment Construction

[0022] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0023] Aiming at the problem that the existing detection method cannot accurately locate the position of the radiation source of the product electromagnetic compatibility test, the present invention provides a method that can accurately measure the specific position of the EMC problem of the product. The method mainly uses a miniaturized antenna probe, a preamplifier and a spectrum analyzer Combined, the radiation signal is received by the miniaturized antenna, and after being amplified by the preamplifier, the change of the radiation intensity is displayed on the spectrum analyzer to confirm the sp...

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Abstract

The invention provides a method for measuring the specific location with excessive EMC problems in a product. According to the method, a miniaturized antenna probe is used for receiving an EMC radiation source signal; after amplification on the signal by a preamplifier, the amplified signal is inputted into a frequency spectrograph; the frequency spectrograph displays intensity information of theradiation source signal measured by the antenna probe; and when the antenna probe moves continuously, the signal intensity displayed by the frequency spectrograph is observed, wherein the position with the highest signal intensity is an EMC radiation source position. According to the invention, with fixed-point positioning and determination of the EMC exceeding position, a source of an EMC problemof the product is found out conveniently.

Description

technical field [0001] The invention belongs to the technical field of electromagnetic compatibility testing, and in particular relates to a method for measuring the specific position of a product EMC problem. Background technique [0002] Electromagnetic compatibility (EMC) is a comprehensive evaluation of the electromagnetic field interference (EMI) and anti-interference ability (EMS) of electronic products. It is one of the most important indicators of product quality. The measurement of electromagnetic compatibility consists of test sites and test instruments. The electromagnetic interference test is to measure the size of the electromagnetic wave signal generated and emitted by the equipment under test under normal working conditions to reflect the strength of the interference to the surrounding electronic equipment. The electromagnetic susceptibility test is to measure the anti-interference ability of the equipment under test to electromagnetic disturbance. [0003] A...

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/001
Inventor 李斌李建生
Owner 深圳市科卫泰实业发展有限公司