Battery piece EL dark patch defect detection method based on region growing algorithm

A technology of region growth and detection method, which is applied in the direction of optical testing flaws/defects, measuring devices, and material analysis through optical means, which can solve problems such as uneven brightness of EL images and difficulties in automatically identifying EL defects of cells, and meet the requirements of The effect of judging accuracy, improving accuracy and adaptability, and improving stability

Active Publication Date: 2018-02-23
HEBEI UNIV OF TECH +1
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Problems solved by technology

[0006] In view of the deficiencies in the prior art, the technical problem to be solved by the present invention is: polysilicon will produce a variety of irregular backgrounds when electroluminescent, and the brightness of the EL images...

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  • Battery piece EL dark patch defect detection method based on region growing algorithm
  • Battery piece EL dark patch defect detection method based on region growing algorithm
  • Battery piece EL dark patch defect detection method based on region growing algorithm

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Embodiment Construction

[0040] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0041] refer to figure 1 as shown, figure 1 It is a flowchart of the detection method of the present invention,

[0042] A method for detecting black spot defects in EL images of polycrystalline silicon solar cells based on a region growing algorithm, the method is divided into two steps:

[0043] 1-1. Image collection: the near-infrared camera collects grayscale images of EL detection solar cells, and the computer reads them;

[0044] 1-2. Binarized image:...

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Abstract

The invention discloses a method used for detecting polysilicon solar energy battery piece EL image surface dark patch defects. According to the method, binaryzation extraction of a target battery pieces is carried out based on a battery piece EL image collected using a near infrared camera, image segmentation is carried out through a region growth mode based on complex and various background interferences caused by polysilicon so as to obtain possible defect connected domains; two methods are adopted for elimination of false detection, wherein according to one method, connected domain analysis is carried out so as to extract connected domain area and opening area characteristics, and according to the other method, the images corresponding to the connected domains are subjected to curve detection so as to eliminate false detection through image texture analysis. The method is capable of determining solar energy battery piece dark patch defects accurately, and realizing locating of darkpatch defects.

Description

technical field [0001] The invention belongs to the field of industrial visual inspection and image processing technology, in particular to a method for detecting black spot defects on the surface of EL images of polycrystalline silicon solar cells. Background technique [0002] As a new renewable clean energy, solar energy has a wide range of sources, good economic benefits and is not restricted by geographical location and environment. It can be obtained well and has become the fastest growing and most dynamic research in recent years. field. [0003] At present, due to the complex production process of the photovoltaic industry, there are often color differences or the produced cells will have defects such as broken grids, cracks, low efficiency, black spots, hidden cracks, and leakage. At the present stage, the country mainly relies on artificial naked eyes to identify these defects, which is greatly affected by subjectivity, and will increase the cost of enterprises an...

Claims

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Application Information

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IPC IPC(8): G01N21/95G01N21/88
CPCG01N21/8851G01N21/95G01N2021/8854G01N2021/8887
Inventor 刘坤闫皓炜韩江锐李爱梅文熙陈海永崔海根于矗卓胡洁樊雷雷王玉
Owner HEBEI UNIV OF TECH
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