Binocular stereo vision three-dimensional measurement method based on line structured light scanning

A binocular stereo vision and three-dimensional measurement technology, which is applied to measuring devices, optical devices, instruments, etc., can solve the problems of cumbersome calibration process and low calibration accuracy, reduce the difficulty of matching, ensure measurement accuracy, and improve robustness and ease of use

Inactive Publication Date: 2018-04-13
CHANGSHA XIANGJI HAIDUN TECH CO LTD
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Problems solved by technology

To achieve 3D measurement based on line structured light, it is necessary to calibrate the positional relationship between the camera and the la

Method used

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  • Binocular stereo vision three-dimensional measurement method based on line structured light scanning
  • Binocular stereo vision three-dimensional measurement method based on line structured light scanning
  • Binocular stereo vision three-dimensional measurement method based on line structured light scanning

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Embodiment Construction

[0049] The present invention will be further described below in conjunction with the accompanying drawings.

[0050] The technical solution adopted in the present invention is: use the line laser to scan the surface of the workpiece to be measured, the line laser is modulated by the three-dimensional topography of the workpiece surface and deformed, and the line laser light strip is extracted and thinned by the binocular industrial camera imaging system, and based on the Line constraints and light strip position constraints are used to match and reconstruct light strips, so as to obtain the three-dimensional shape of the workpiece to be measured.

[0051] The three-dimensional measuring method described in the present invention comprises the following steps:

[0052] 1) Use the left camera and the right camera to capture the checkerboard calibration target images at different positions at the same time, extract the sub-pixel-level corner coordinates in the image, and perform s...

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Abstract

The invention discloses a binocular stereo vision three-dimensional measurement method based on line structured light scanning, which comprises the steps of performing stereo calibration on binocularindustrial cameras, projecting laser light bars by using a line laser, respectively acquiring left and right laser light bar images, extracting light bar center coordinates with sub-pixel accuracy based on a Hessian matrix method, performing light bar matching according to an epipolar constraint principle, and calculating a laser plane equation; secondly, acquiring a line laser scanning image of aworkpiece to be measured, extracting coordinates of the image of the workpiece to be measured, calculating world coordinates of the workpiece to be measured by combining binocular camera calibrationparameters and the laser plane equation, and recovering the three-dimensional surface topography of the workpiece to be measured. Compared with a common three-dimensional measurement system combininga monocular camera and line structured light, the binocular stereo vision three-dimensional measurement method avoids complicated laser plane calibration. Compared with the traditional stereo vision method, the binocular stereo vision three-dimensional measurement method reduces the difficulty of stereo matching in binocular stereo vision while ensuring the measurement accuracy, and improves the robustness and the usability of a visual three-dimensional measurement system.

Description

technical field [0001] The invention relates to the technical field of computer vision three-dimensional measurement, in particular to a binocular stereoscopic three-dimensional measurement method for line structured light scanning. Background technique [0002] Line structured light three-dimensional measurement technology is to project structured light strips on the surface of the measured object, use the camera to obtain the light strip image and analyze and process it, and use the optical triangulation measurement principle to recover the three-dimensional contour information of the measured object. It has high measurement accuracy and fast speed, and is currently widely used in industrial measurement and other fields. To achieve 3D measurement based on line structured light, the positional relationship between the camera and the laser plane needs to be calibrated first, but most of the traditional calibration methods have shortcomings such as low calibration accuracy an...

Claims

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Application Information

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IPC IPC(8): G01B11/00G01B11/24
CPCG01B11/00G01B11/2433
Inventor 肖玉飞周翔刘俊涂宏斌周继辉田炜
Owner CHANGSHA XIANGJI HAIDUN TECH CO LTD
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