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A Visual Instrument-Based Graphical Apparatus for Output Characteristic Curve of Crystal Transistor

An output characteristic curve, transistor technology, applied in bipolar transistor testing, instruments, single semiconductor device testing and other directions, can solve the problems of high price, complex structure, etc., to achieve low cost, small size, improve the effect of bulky

Active Publication Date: 2019-11-12
JILIN UNIV +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Based on this, it is necessary to provide a virtual instrument-based crystal triode output characteristic curve diagram for the existing digital transistor graph instrument, which has complex structure, expensive price, and is not suitable for some occasions that do not require high-precision measurement. instrument

Method used

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  • A Visual Instrument-Based Graphical Apparatus for Output Characteristic Curve of Crystal Transistor
  • A Visual Instrument-Based Graphical Apparatus for Output Characteristic Curve of Crystal Transistor
  • A Visual Instrument-Based Graphical Apparatus for Output Characteristic Curve of Crystal Transistor

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Embodiment Construction

[0023] The technical solutions of the present invention will be described in detail below in conjunction with the accompanying drawings and preferred embodiments.

[0024] Virtual instrument technology (Virtual instrument) is the use of high-performance modular hardware, combined with efficient and flexible software (such as LabVIEW) to complete a variety of testing, measurement and automation applications.

[0025] In one of the examples, as figure 1 As shown, a crystal triode output characteristic curve grapher based on a virtual instrument includes a host computer 100, a LabVIEW board 200, a buffer stage 300 and a hardware measurement circuit 400, wherein the LabVIEW board 200 includes a D / A conversion module 210 , a DIO signal module 220 and an A / D conversion module 230 .

[0026] The upper computer 100 communicates with the LabVIEW board 200, the D / A conversion module 210 is connected to the input end of the hardware measurement circuit 400 through the buffer stage 300, ...

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Abstract

The invention relates to a crystal triode output characteristic curve illustrator based on a virtual instrument, and belongs to the technical field of electronic instruments. The crystal triode outputcharacteristic curve illustrator comprises a host computer, a LabVIEW card, a buffer stage and a hardware measurement circuit. The LabVIEW card includes a D / A conversion module. a DIO signal module and an A / D conversion module. The host computer is communicatively connected to the LabVIEW card. The D / A conversion module is connected to the input end of the hardware measurement circuit through thebuffer stage. The output end of the hardware measurement circuit is connected to the A / D conversion module. The DIO signal module is connected to the hardware measurement circuit. The DIO signal module is configured to control the resistance value of each load in the hardware measurement circuit according to a crystal triode to be tested. Resistance; The hardware measurement circuit includes a measurement circuit unit. The crystal triode output characteristic curve illustrator can measure and display the output characteristic curve of an NPN transistor or a PNP transistor in real time, and has the advantages of small size, portability, simple structure, convenient operation, good practicability and low cost.

Description

technical field [0001] The invention relates to the field of electronic instruments, in particular to a crystal triode output characteristic curve graphing instrument based on a virtual instrument. Background technique [0002] Transistor characteristic tracer is a measuring instrument that can observe and test the characteristic curve and DC parameters of transistors on the oscilloscope screen. Traditional transistor characteristic tracers are generally large in size and have limited functions. Based on analog display, the test error is large, it is difficult to obtain more accurate test values, and the cost is high. [0003] With the development of science and technology and the improvement of demand, the introduction of embedded technology, liquid crystal display technology, interface expansion and the continuous optimization of test circuits make the transistor characteristic tracer continue to be integrated, intelligent, high-precision and multi-functional. With the de...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
CPCG01R31/2603G01R31/2608
Inventor 张秉仁刘卫平杨媛如
Owner JILIN UNIV
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