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Static Fourier Transform Spectrometer

A Fourier transform and spectrometer technology, applied in interference spectroscopy, instruments, spectrometry/spectrophotometry/monochromator, etc., can solve problems such as difficulty in adjusting Mach-Zehnder interferometers

Active Publication Date: 2020-09-01
TECH UNIV MUNCHEN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, tuning of a static modified Mach-Zehnder interferometer is much more difficult than a static common-path interferometer

Method used

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  • Static Fourier Transform Spectrometer

Examples

Experimental program
Comparison scheme
Effect test

no. 2 example

[0089] Second Embodiment: Focus Shift by Convex Lens

[0090] Previously, mention was made of the need to position the light source 14 close to the front of the beam splitter 2 to ensure a high luminous flux. Since this can cause problems in many cases, the second exemplary embodiment presented below describes the possibility of spectroscopically measuring collimated radiation from a more distant light source 14 while improving the luminous flux by using upstream optics 10 . The upstream optics 10 specifically comprise a second lens. Figure 4 A second embodiment of the invention is shown, corresponding to the first embodiment but with an additional lens.

[0091] If in an application approximately collimated light to be measured spectroscopically is available from the light source 14 , an additional convex lens can be attached to the input of the structure as upstream optics 10 . This upstream optic focuses the incoming light to a new focal point. This focus reappears i...

no. 4 example

[0100] Fourth Example: Imaging Spectrometer Variations

[0101] Figure 12 and 13 A fourth exemplary embodiment of a static Fourier transform spectrometer according to the invention is shown. In the fourth embodiment, an array area detector 16 is used. Figure 12 A view of the static Fourier transform spectrometer 1 is shown such that the first dimension 17 of the arrayed area detector 16 is shown. Figure 13 A view showing the second dimension 18 of the array area detector 16 is shown.

[0102] Similarly, Figure 14 and 15 A static Fourier transform spectrometer1 shown in operation, Figure 14 view corresponding to Figure 12 view of the Figure 15 view corresponding to Figure 13 view.

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Abstract

The invention relates to a static Fourier transform spectrometer (1), comprising a beam splitter (2), a mirror device (3) and a light concentrating device (4), wherein the beam splitter (2) receives an input beam (5) into a first branch (6) and into a second branch (7), wherein the first branch (6) is reflected by the beam splitter and the second branch (7) passes through the beam splitter (2), wherein said first branch (6) extends without deflection to said converging optical unit (4) after reflection at said mirror arrangement (3), wherein said second A branch (7) extends without deflection to the converging optical unit (4) after passing through the beam splitter (2), and wherein the concentrating device (4) makes the first branch A path (6) and said second branch (7) merge for interference (13).

Description

technical field [0001] The invention relates to a static Fourier transform spectrometer. Background technique [0002] Fourier Transform Infrared Spectroscopy (FTIR Spectroscopy) has established itself as a standard method for spectroscopic analysis of infrared radiation due to its high signal-to-noise ratio and high spectral resolution. Due to the absorption properties of individual molecules for infrared radiation, the chemical composition of gases, liquids and solids can be determined non-destructively by means of infrared spectroscopy. For example, numerous FTIR spectrometers are used commercially for process control, for example in pharmaceutical production for quality control, or in dairy plants for on-line milk fat measurement. [0003] The operation of commercially available FTIR spectrometers under adverse environmental conditions (specifically, temperature fluctuations or vibrations) is only possible through complex and expensive compensation techniques due to the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/453G01J3/02
CPCG01J3/021G01J3/453G01J3/4531G01J3/45
Inventor 麦可·史查德
Owner TECH UNIV MUNCHEN