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Static Fourier transform spectrometer

A technology of Fourier transform and spectrometer, which is applied in the direction of interference spectroscopy, instrumentation, spectrometry/spectrophotometry/monochromator, etc., and can solve problems such as difficult adjustment of Mach-Zehnder interferometer

Active Publication Date: 2018-04-20
TECH UNIV MUNCHEN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, tuning of a static modified Mach-Zehnder interferometer is much more difficult than a static common-path interferometer

Method used

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  • Static Fourier transform spectrometer

Examples

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Effect test

no. 2 example

[0089] Second embodiment: focus shift by means of convex lens

[0090] Previously, the need to position the light source 14 close to the front of the beam splitter 2 was mentioned to ensure a high luminous flux. Since this can be problematic in many cases, the second exemplary embodiment presented below describes the possibility of spectrally measuring collimated radiation from a more distant light source 14 while improving the luminous flux by using upstream optics 10 . The upstream optics 10 specifically include a second lens. Figure 4 A second embodiment of the invention is shown, which corresponds to the first embodiment but with additional lenses.

[0091] If, in application, substantially collimated light to be measured spectrally is available from the light source 14, then an additional convex lens can be attached to the input of the structure as the upstream optics 10. This upstream optic concentrates the incident light to a new focal point. This focus reappears ...

no. 4 example

[0100] Fourth Embodiment: Imaging Spectrometer Variation

[0101] Figure 12 and 13 A fourth exemplary embodiment of a static Fourier transform spectrometer according to the present invention is shown. In the fourth embodiment, the array area detector 16 is used. Figure 12 A view of the static Fourier transform spectrometer 1 is shown such that the first dimension 17 of the array area detector 16 is shown. Figure 13 A view showing the second dimension 18 of the array area detector 16 is shown.

[0102] Similarly, Figure 14 and 15 Static Fourier Transform Spectrometer 1 shown in operation, Figure 14 The view corresponds to Figure 12 view, while Figure 15 The view corresponds to Figure 13 view.

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Abstract

The invention relates to a static Fourier transform spectrometer (1), comprising a beam splitter (2), a mirror apparatus (3) and a converging optical unit (4), wherein the beam splitter (2) divides aninput light beam (5) into a first arm (6) and into a second arm (7), wherein the first arm (6) is reflected by the beam splitter and the second arm (7) passes through the beam splitter (2), wherein the first arm (6) extends to the converging optical unit (4) without deflection after reflection at the mirror apparatus (3), wherein the second arm (7) extends to the converging optical unit (4) without deflection after passing through the beam splitter (2), and wherein the converging optical unit (4) brings together the first arm (6) and the second arm (7) for interference (13).

Description

technical field [0001] The invention relates to a static Fourier transform spectrometer. Background technique [0002] Fourier transform infrared spectroscopy (FTIR spectroscopy) has established itself as a standard method for the spectral analysis of infrared radiation due to its high signal-to-noise ratio and high spectral resolution. Due to the absorption properties of the individual molecules for infrared radiation, the chemical composition of gases, liquids and solids can be determined non-destructively by means of infrared spectroscopy. For example, numerous FTIR spectrometers are used commercially for process control, such as for quality control in pharmaceutical production, or for on-line milk fat measurement in dairy plants. [0003] Commercially available FTIR spectrometers contain movable components due to their mode of operation, making operation of such spectrometers under adverse environmental conditions (in particular, temperature fluctuations or vibrations) ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/453G01J3/02
CPCG01J3/021G01J3/453G01J3/4531G01J3/45
Inventor 麦可·史查德
Owner TECH UNIV MUNCHEN