Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and device for measuring normal vector of free surface at any point

A normal vector and arbitrary point technology, applied in the field of optical measurement, can solve problems such as measurement errors, and achieve the effects of eliminating complicated processes, high cost performance, and fewer measurement data points

Pending Publication Date: 2018-04-24
AVIC BEIJING AERONAUTICAL MFG TECH RES INST
View PDF1 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage of this method is that the straight line determined by the two feedback data of two laser sensors is used to approximate the tangential vector of the simulated curve, and then converted into a normal vector, which is another transformation form of the rectangular patch method. When the curvature of the free-form surface, or when there are interference factors such as beams or steps near the point to be measured, there will inevitably be measurement errors

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for measuring normal vector of free surface at any point
  • Method and device for measuring normal vector of free surface at any point
  • Method and device for measuring normal vector of free surface at any point

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention.

[0033] refer to Figure 1-3 , a device for measuring the normal vector at any point on a free-form surface, including a longitudinal drive device 1, a longitudinal guide rail 2, a fixed frame 3, a hole-making device 12, a longitudinal slide table 4, a transverse drive device 5, a rotary cylinder 6, and a wire The laser sensor 7, the horizontal sliding table 10 and the horizontal guide rail 11, the top of the fixed frame 3 is fixedly connected with the longitudinal driving device 1, the fixed frame 3 is fixedly connected with the longitudinal guide rail 2, and the longitudinal guide rail 2 is slidably connected with a matching longitudinal Sliding table 4, the bottom ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a device for measuring the normal vector of a free surface at any point, including a longitudinal driving device, a longitudinal guide rail, a fixed frame, a hole making device, a longitudinal slide table, a transverse driving device, a rotating cylinder, a linear laser sensor, a transverse slide table and a transverse guide rail. The top end of the fixed frame is fixedly connected with the longitudinal driving device. The longitudinal guide rail is fixedly connected inside the fixed frame. The longitudinal guide rail is connected in a sliding manner with the matching longitudinal slide table. The hole making device is installed at the bottom end of the longitudinal slide table. The output end of the longitudinal driving device is fixedly connected with the top endof the longitudinal slide table. The bottom end of the fixed frame is fixedly connected with the transverse guide rail. The right side of the bottom end of the fixed frame is fixedly connected with the transverse driving device. The complex process of surface fitting is omitted. The problem that the precision of measurement of the normal vector will be affected when there is an interference factorsuch as a crossbeam or a step near a point to be measured for the mainstream rectangular surface patch method at present can be solved.

Description

technical field [0001] The invention relates to the technical field of optical measurement, in particular to a method and a device for measuring a normal vector at an arbitrary point on a free-form surface. Background technique [0002] Relying on the high flexibility of robots, robotic automatic drilling and riveting technology has become a research hotspot in the automatic drilling and riveting technology of large aircraft parts. In the robot automatic drilling and riveting system, flexible hole making is an important link for flexible drilling and riveting of thin-walled structures. The verticality of the hole position of the riveting point directly affects the riveting quality of the panel. Highly complex application fields have put forward high requirements for the normal alignment of flexible drilling. Since the skin mostly adopts a riveted structure, the hole quality defect caused by the out-of-tolerance normal precision of the drilling directly affects the aerodynam...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/00G01C15/00B23B49/00
CPCG01B11/00G01C15/004B23B49/00
Inventor 姜超浪翟旭东
Owner AVIC BEIJING AERONAUTICAL MFG TECH RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products