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Method for determining reliability degree of minimum subsample ion thruster based on acceleration gate data

A technology for ion thrusters and determining methods, which is applied in the direction of instruments, machine/structural component testing, and measuring devices, and can solve the problems of ion thrusters with little life data and inability to conduct reliability assessments, and achieve discreteness The effect of poor information and improved accuracy

Active Publication Date: 2018-04-27
CHINA ACADEMY OF SPACE TECHNOLOGY
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Problems solved by technology

[0005] The technical solution solved by the present invention is: to overcome the deficiencies of the prior art, to provide a method for determining the reliability of the ion thruster based on the acceleration grid data of a very small sample, and to solve the problem that the ion thruster has very little life data and cannot be evaluated for reliability

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  • Method for determining reliability degree of minimum subsample ion thruster based on acceleration gate data
  • Method for determining reliability degree of minimum subsample ion thruster based on acceleration gate data
  • Method for determining reliability degree of minimum subsample ion thruster based on acceleration gate data

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Embodiment Construction

[0031] The method of determining the reliability of the ion thruster based on the accelerator grid data requires the same structure of the accelerator grid and the following two basic assumptions:

[0032] Assumption 1: The lifetime of the ion thruster and the lifetime of the accelerator grid obey the Weibull distribution.

[0033] Hypothesis 2: The penetrating corrosion in the thickness direction of the accelerated grid occurs before the penetrating corrosion in the hole wall direction. This basic assumption can be ensured by coordinating the margin design of the thickness of the accelerating grid and the width of the connecting rib of the grid hole. The schematic diagram of the accelerator grid structure is shown in figure 1 .

[0034] Under the above basic assumptions, the life of the ion thruster mainly depends on the life of the acceleration grid corresponding to the penetrating corrosion in the thickness direction of the acceleration grid. According to the principle of...

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Abstract

The invention discloses a method for determining a reliability degree of a minimum subsample ion thruster based on acceleration gate data. The method comprises the steps of: 1) acquiring whole machinelife test data of the ion thruster; 2) acquiring test data of an acceleration gate component; 3) determining shape parameters of thruster life; 4) and evaluating the reliability of the ion thruster,so as to obtain the reliability degree. According to the method, a model of an empirical relationship between acceleration gate life in an acceleration gate component test and the thruster life in a whole machine life test is established, the shape parameters of the thruster life are obtained by utilizing the test data of the acceleration gate component, further the reliability of the ion thrusteris evaluated, and the problem of ion thruster reliability evaluation under the condition that the whole machine life data is very few (only 1 or 2 pieces) is solved.

Description

technical field [0001] The invention belongs to the technical field of ion thruster reliability evaluation, and in particular relates to a method for determining the reliability of an ion thruster of a very small sample based on acceleration grid data, and especially relates to the situation that the life data of the whole machine is extremely small. Background technique [0002] The electric propulsion system is an advanced space propulsion system, which has the characteristics of high specific impulse, high efficiency, and low thrust. It can effectively improve the service life and carrying capacity of satellites in orbit. In recent years, it has been more and more widely used in space propulsion. Compared with chemical propulsion, electric propulsion has the outstanding advantage of high specific impulse, which can greatly reduce the amount of propellant carried by satellites, thereby increasing the payload ratio of satellites, prolonging on-orbit life, and reducing launch...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M99/00
CPCG01M99/005
Inventor 林逢春王敏王宗仁仲小清王学望
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
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