Method for checking perpendicularity between adjacent axes of dual-axis rotary inertial measurement device by using accelerometer
An inertial measurement device and dual-axis rotation technology, applied in measurement devices, instruments, etc., can solve the problems of cumbersome process and long time-consuming, and achieve the effect of shortening time, reducing cost, and ingenious design ideas.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Example Embodiment
[0038] The following describes the embodiments of the present invention in detail with reference to the accompanying drawings. It should be noted that this embodiment is descriptive and not restrictive, and the protection scope of the present invention cannot be limited by this.
[0039] A method for checking the verticality of adjacent axes of a dual-axis rotating inertial measurement device using an accelerometer, including the following steps:
[0040] ⑴. Determine the composition of verticality error:
[0041] image 3 Where α is the angle between the axis of the outer frame and the plumb line, β is the perpendicularity between the axis of the inner frame and the axis of the outer frame, and γ is the installation error angle of the accelerometer;
[0042] ⑵. Leveling dual-axis rotating inertial measurement device:
[0043] Rotate the azimuth axis of the dual-axis rotating inertial measurement device 1, and read the output of the quartz flexible accelerometer 3 at 0°, 90°, 180°, 270°...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap