Method for acquiring impact kinetic parameter of transparent material

Abstract

The invention belongs to the field of measurement of material impact kinetic parameters, and discloses a method for acquiring an impact kinetic parameter of a transparent material. The method comprises the following steps: (a) establishing a double-layer film layered model of a transparent film sample under stable impact wave loading; (b) proving that the reflected light phase has periodic oscillation characteristic on the waveform of time derivative when P polarized light enters the sample by a Brewster angle by utilizing the first principle, and deducing an expression formula between the oscillation characteristic and the impact kinetic parameter; (c) measuring the actual oscillation cycle, the actual amplitude value and the actual oscillation derivation value of the to-be-measured sample by a pump detection testing system; and (d) plugging the acquired measuring actual values into the acquired expression formula so as to acquire the actual impact kinetic parameter. By the method, the impact kinetic parameter of the transparent material is directly extracted by using the formula in a double-layer film model, the measuring light path used by the method is simple and easy to implement, and the data is easy to process.

Description

technical field [0001] The invention belongs to the field of measurement of impact dynamic parameters of materials, and more particularly relates to a method for acquiring impact dynamic parameters of transparent materials. Background technique [0002] Studying the dynamic response characteristics of materials under extreme conditions such as high pressure and high strain rate is a frontier topic in the field of material physics, and shock wave loading is an important technical means to generate such extreme conditions inside materials. When a shock wave propagates in a material, the study of the shock wave and the response characteristics of the material usually requires the measurement of the dynamic parameters of the material, such as the shock wave velocity, the particle velocity after the wave, and so on. In addition, the changes in material density and internal structure caused by the shock wave transiting through the material will eventually lead to changes in the ov...

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Problems solved by technology

[0004] Aiming at the above defects or improvement needs of the prior art, the present invention provides a method for obtaining the impact dynamic parameters of transparent materials, by deriving the phase of the reflected light in the double-layer film model when P polarized light is incident on the sample at Brewster's angle The derivative φ′(t) of the change process with respect to time, and then obtained the oscillation characteristics of φ′(t) (including oscillation period, amplitude, oscillation deviation value) and shock dynamic parameters (including shock wave velocity, post-wave particle velocity, shock The relationship between the refractive index of the sample after compression) solves the technical problem that the dynamic parameters of the transparent material double-layer film model under shock wave loading can only be extracted by fitting and inversion, and the shock dynamic parameters cannot be directly calculated using the formula

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