Semiconductor power device sub module and production method thereof and crimping-type IGBT module
A technology of power devices and production methods, which is applied in the direction of semiconductor devices, semiconductor/solid-state device manufacturing, semiconductor/solid-state device components, etc., can solve problems such as poor heat transfer performance, achieve strong thermal conductivity, and ensure the effect of heat transfer capabilities
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Embodiment 1
[0036] The present embodiment provides a kind of production method of semiconductor power device sub-module, comprises the steps: S1. on the silver-plated surface 11 of molybdenum sheet 1, deposits AgSn film solder paste, and silver-plated surface 11 is arranged near described chip 2; S2 . Mount the chip 2 on the surface of the AgSn thin film solder paste through a fixture to form a structure to be sintered.
[0037] In the prior art, the heat transfer efficiency between the various modules of the IGBT is low, resulting in poor overall heat dissipation performance, which easily affects the stability of use.
[0038] In the production method of the semiconductor power device sub-module provided in this embodiment, AgSn is first deposited on the molybdenum sheet 1, and AgSn has a strong thermal conductivity, which can ensure the heat transfer capability of the entire sub-module.
[0039] In this embodiment, in the step S1, the AgSn thin film solder paste is deposited on the moly...
Embodiment 2
[0051] This embodiment provides a semiconductor power device sub-module, using the production method of the semiconductor power device sub-module recorded in Embodiment 1, the semiconductor power device sub-module includes: a molybdenum sheet 1; a chip 2, and the The opposite side of the molybdenum sheet 1 is provided with a first electrode and is provided with AgSn film solder paste, and the side of the chip 2 different from the AgSn film solder paste is provided with a second electrode; The two electrodes are bonded together; and an insulating frame 4 is used to accommodate the molybdenum sheet 1 , the chip 2 and the lower pad 3 .
[0052] The semiconductor power device sub-module further includes: a third electrode arranged on the chip 2 at one side of the second electrode; a gate probe 5 arranged vertically with the chip 2 and connected at one end to the The third electrodes are in contact. The chip 2 is provided with a corner, and the gate probe 5 is embedded in the corn...
Embodiment 3
[0059] This embodiment provides a crimping type IGBT module, comprising: the semiconductor power device sub-module described in Embodiment 2; A gate terminal to which one end of the gate probe 5 is connected; a collector disposed on a side of the molybdenum sheet 1 close to the semiconductor power device sub-module.
[0060] Specifically, the gate probe 5 is in contact with the gate terminal to ensure electrical conduction between the two. At this time, the other end of the gate terminal is in contact with the collector. Since the collector can also conduct electricity, the Through the above structure, the electric signal can be passed through the sub-module and the collector of the semiconductor power device in a timely manner.
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Abstract
Description
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