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Continuous temperature correction method and system for accelerometer scale factor

A technology of accelerometer and scale factor, which is applied in the testing/calibration of speed/acceleration/shock measurement equipment, speed/acceleration/shock measurement, and measuring devices, etc., which can solve the problems of low precision, low compensation efficiency, and inaccurate fitting curves. Accuracy and other issues to achieve the effect of improving accuracy, reducing manual operations, and improving test efficiency

Active Publication Date: 2018-06-01
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST THE FIFTH ELECTRONICS RES INST OF MIITCEPREI LAB
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Problems solved by technology

[0005] Based on this, it is necessary to address the problems of inaccurate fitting curves, reduced compensation efficiency and low precision. The present invention provides a continuous temperature correction method and system for accelerometer scale factors

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  • Continuous temperature correction method and system for accelerometer scale factor
  • Continuous temperature correction method and system for accelerometer scale factor
  • Continuous temperature correction method and system for accelerometer scale factor

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Embodiment Construction

[0033] In order to make the purpose, technical solution and advantages of the present invention clearer, the method and system for continuous temperature correction of the accelerometer scale factor of the present invention will be further described in detail through the following examples and in conjunction with the accompanying drawings.

[0034] It should be understood that, unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for describing specific embodiments only, and are not intended to limit the present invention.

[0035] The continuous temperature correction method and system embodiments of the accelerometer scale factor of the present invention can be based on the MEMS accelerometer to study the correction method of the scale factor changing with temperature, involving...

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Abstract

The invention discloses a continuous temperature correction method and system for an accelerometer scale factor, and relates to the technical field of accelerometers. The method includes: when an accelerometer is installed on a thermostat turntable and is powered on, continuously acquiring, according to a preset acquisition frequency, multiple pieces of first output voltage data of the accelerometer in a first state, multiple pieces of second output voltage data of the accelerometer in a second state, and multiple pieces of third output voltage data of the accelerometer in a third state, acquiring the scale factor data corresponding to each piece of temperature data according to the multiple pieces of first output voltage data and the multiple pieces of second output voltage data, fittingeach piece of temperature data and the corresponding multiple pieces of scale factor data, establishing a mathematical model of the scale factor to the temperature and correcting the accelerometer's scale factor on this basis. By continuously acquiring the scale factor data when the temperature changes, the method can correct the accelerometer scale factor at continuous temperature points, and canimprove the accuracy of the accelerometer scale factor at any temperature.

Description

technical field [0001] The invention relates to the technical field of accelerometers, in particular to a continuous temperature correction method and system for accelerometer scale factors. Background technique [0002] Micro-mechanical accelerometers are made based on MEMS (Micro-Electro-Mechanical System, micro-mechanical systems) processing technology, also known as MEMS accelerometers, which can be used to measure the acceleration information of moving carriers, and have been used in military, industrial, inertial navigation , Instrument testing, medicine and consumer electronics and other fields have been widely used. [0003] Due to the processing error of the sensitive structure of the accelerometer and the particularity of the material structure, when the working environment changes, the zero bias and scale factor of the accelerometer will drift, which will affect the accuracy of the system (such as the inertial navigation system), especially the environment Temper...

Claims

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Application Information

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IPC IPC(8): G01P21/00
CPCG01P21/00
Inventor 董显山黄钦文杨少华恩云飞
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST THE FIFTH ELECTRONICS RES INST OF MIITCEPREI LAB
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