Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for detecting bandwidth flatness and consistency of multichannel digital oscilloscope

A digital oscilloscope and detection method technology, applied in the direction of instruments, measuring devices, measuring electrical variables, etc., can solve time-consuming problems, achieve the effects of improving pass rate, shortening research and development time, and improving production efficiency

Active Publication Date: 2018-06-01
FUJIAN LILLIPUT OPTOELECTRONICS TECH
View PDF8 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method is time-consuming, and in actual industrial production, hundreds of instruments often need to be tested a day, so it is definitely not feasible to use this method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for detecting bandwidth flatness and consistency of multichannel digital oscilloscope
  • Method and system for detecting bandwidth flatness and consistency of multichannel digital oscilloscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0044] exist figure 1 In the flow chart shown, the program controls the oscilloscope calibrator to output a high and low level as the start mark, then continuously output a series of standard sinusoidal signals from low frequency to high frequency, and finally output a high and low level as the end mark, the program passes the waveform The recognition algorithm cuts off the high and low levels representing the start position and the high and low levels representing the end position from the waveform data collected from the oscilloscope. Through the interception operation, the collected original signal is processed into a signal that changes from sparse to dense. The oscilloscope should be set in the slow sweep state when acquiring this section of waveform, and ensure that the sampling rate of the oscilloscope at this time is much higher than twice the highest frequency of the output signal of the oscilloscope calibrator. This section of signal that changes from sparse to dens...

Embodiment 2

[0046] Because most of the oscilloscopes produced have not only one channel, but two or four, or more. This requires our detection system to detect the bandwidth flatness of multiple channels at the same time, and then calculate the consistency between each channel. In this way, it takes the same time to inspect multiple channels as to detect one channel, which greatly improves the production efficiency and greatly reduces the time cost. And it gives very intuitive and accurate results. The process steps are similar to those in Example 1, except that at this time, all channels of the oscilloscope must be connected to the output channels of the oscilloscope calibrator, and the oscilloscope calibrator is set to output multiple channels of the same signal at the same time, and the data of multiple channels are collected. Enter the calculation terminal for processing to obtain the frequency response curves of multiple channels. By drawing these curves together, it is very conveni...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method and system for detecting the bandwidth flatness and consistency of a multichannel digital oscilloscope, and the method comprises the following steps: S1, enabling an oscilloscope standard instrument to output high and low levels to all channels; S2, enabling the oscilloscope standard instrument to continuously output standard sine waves from 1Hz to the maximum bandwidth; S3, enabling the oscilloscope to scan the standard sine wave of each channel; S4, enabling the oscilloscope standard instrument to output an end identification to each channel; S5, enabling a detection program to extract the intensive waveform data collected by each channel of the oscilloscope; S6, dividing the data of the intensive waveform into a plurality of parts, and carrying out the waveform interception; S7, calculating the amplitude of each part of waveform data; S8, connecting the calculated amplitudes of all frequency points of all channels, and obtaining a corresponding frequency response curve; S9, comparing the consistency of all channels on the same image, and recording the frequency point with the maximum difference and the corresponding channel as oscilloscope consistency parameters. The method speeds up the circuit bandwidth debugging, and shortens a product research and development time.

Description

technical field [0001] The invention relates to the field of detection equipment, in particular to a multi-channel digital oscilloscope bandwidth flatness and consistency detection method and system thereof. Background technique [0002] As a key indicator of a digital oscilloscope, the flatness of the frequency response curve and the consistency of the curves between channels are direct technical indicators for judging the quality of an oscilloscope. Good bandwidth flatness can ensure that the signal under test can be restored without distortion as much as possible. When each channel collects the same signal with different frequencies, whether the displayed waveforms are consistent is a very intuitive reflection of the quality of the oscilloscope. The traditional methods for testing the frequency response curve of a digital oscilloscope include: (1) Input a step signal to obtain the step response of the digital oscilloscope, and perform a series of algorithms such as deriv...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R35/00
CPCG01R35/007
Inventor 蓝思凡吴朝荣薛增鑫
Owner FUJIAN LILLIPUT OPTOELECTRONICS TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com