Photovoltaic array IV characteristic curve scanning and parameter identification system and method

Abstract

The invention discloses a photovoltaic array IV characteristic curve scanning and parameter identification system and method. The system comprises a data acquisition module, a photovoltaic array IV characteristic curve scanning module, a storage module and a display module, wherein the data acquisition module is used for sampling the temperature and the illuminance of a photovoltaic array and transmitting the temperature and the illuminance to the photovoltaic array IV characteristic curve scanning module through a low-power wireless sensor network; IV characteristic curve scanning is carriedout on the basis of a dynamic capacitance charging method, and output current and voltage of the array are detected and stored; and the scanned IV characteristic curve is converted into an IV curve under the standard condition (STC), IV curve fitting is carried out by using an ABC-NM simplex hybrid algorithm and parameters of a photovoltaic model are accurately identified. The system disclosed bythe invention can be carried outside to assist inspectors in manual detection on the photovoltaic array, can also be put into a junction box and can be connected with an upper computer to achieve real-time online component-level and component string-level distributed photovoltaic array IV curve scanning.

Description

technical field [0001] The invention relates to the technical field of detection of photovoltaic power generation arrays, in particular to a system and method for scanning IV characteristic curves and identifying parameters of photovoltaic arrays. Background technique [0002] As the core of the photovoltaic power generation system, the photovoltaic panel is a power generation device that must be in the outdoor environment for a long time. Therefore, in practical applications, the performance of photovoltaic panels will not only decline with the increase of service life, but also be affected by harsh natural environments and cause failures. The existence of faults will cause low-efficiency operation of the entire system and accelerate the damage of photovoltaic panels. In severe cases, it may even cause fires, cause social property losses, and endanger human life. The collection, modeling, parameter extraction, and parameter analysis and classification of characteristic vol...

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Problems solved by technology

[0006] At present, domestic research on I-V curve testers based on capacitance solutions (especially portable products) is still relatively weak, while some foreign products have high prices, and these testers do not provide the function of extracting photovoltaic internal model parameters, and these Internal parameters are of great significance to the deeper study of photovoltaic power generation systems

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