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Method for measuring bonding capacity between two parallel limited-thickness coating films

A coating and thin film technology, applied in the field of measurement, can solve the problem of difficult to measure the change trend of van der Waals force, and achieve the effect of reducing cost and complexity, improving accuracy and precision, and improving measurement efficiency.

Active Publication Date: 2018-06-05
JIANGNAN UNIV
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

Although the van der Waals interaction between the interfaces has been determined experimentally, due to the limitations of the equipment, it is difficult to measure the change trend of the van der Waals force between the interfaces and the main factors affecting the change of the van der Waals force

Method used

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  • Method for measuring bonding capacity between two parallel limited-thickness coating films
  • Method for measuring bonding capacity between two parallel limited-thickness coating films
  • Method for measuring bonding capacity between two parallel limited-thickness coating films

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Embodiment Construction

[0019] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0020] figure 1 It is a flowchart of a method for measuring the bonding energy between two parallel finite-thickness coating films provided by the embodiment of the present invention, such as figure 1 As shown, the method includes:

[0021] Step 110, according to the van der Waals interaction between the coating and the film, an analytical expression of the bond energy between two parallel graphene films per unit area is established by using the theory of continuum mechanics.

[0022] The van der Waals interaction potential energy between two atoms can be expressed as:

[0023]

[0024] Among them, d represents the distance between two atoms, ∈ represents the non-bonding interaction energy of the equilibrium position, and σ represents the parameter that determines the equilibrium position between the two atoms. Here we regard the graph...

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Abstract

The invention discloses a method for measuring the bonding capacity between two parallel limited-thickness coating films, and relates to the technical field of measurement. The method comprises the following steps: establishing an analytic expression of the bonding capacity between unit areas of two parallel graphene films according to the Van der Waals' force between the coating and the film andby utilizing continuous mechanical theory; determining the balance distance between the two parallel graphene films as the minimal position of the interface bonding capacity, deriving the analytic expression of the bonding capacity between the unit areas of parallel graphene films at the minimal position to acquire graphene film minimal bonding capacity; establishing an analytic expression of thebonding capacity between the unit areas of two parallel limited-thickness coating films by utilizing the continuous mechanical theory. The problem that the Van der Waals' force at the interface position is regarded as a constant value is solved, and the effects of improving the measuring accuracy of the bonding capacity between the unit areas of two parallel limited-thickness coating films, reducing the measuring cost and reducing the complex degree are achieved.

Description

technical field [0001] The invention relates to the field of measurement technology, in particular to a method for measuring the bonding energy between two parallel coating films with limited thickness. Background technique [0002] A lot of research has been done on the interface of thin films at home and abroad, and the van der Waals interaction between the nanometer thin film and the matrix has been determined by experimental instruments. Although the van der Waals interaction between the interfaces has been determined experimentally, due to the limitations of the equipment, it is difficult to measure the change trend of the van der Waals force between the interfaces and the main factors affecting the change of the van der Waals force. [0003] People usually regard the Van der Waals force at the interface as a fixed value, but at the micro-nano scale, there is an interaction force between atoms, that is, the Van der Waals interaction force, and the magnitude of the Van d...

Claims

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Application Information

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IPC IPC(8): G01N19/04
Inventor 赵军华董淑宏鲜敏于培师刘汝盟
Owner JIANGNAN UNIV
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