Method and system for predicting failure rate induced by atmosphere neutrons of electronic device
A technology for atmospheric neutrons and electronic devices, which can be used in instruments, measurement of electricity, and measurement of electrical variables, etc., can solve the problem of cumbersome analysis of radiation-sensitive characteristics, solve the lack of single-event effect evaluation methods for electronic devices, and simplify radiation-sensitive characteristics. The analysis process and the acquisition process are simple and efficient
Inactive Publication Date: 2018-06-08
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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[0004] Based on this, it is necessary to provide a method and system for predicting the failure rate of electronic devices induced by atmospheric neutrons in view of the cumbersome analysis process of the radiation sensitivity characteristics of electronic devices under atmospheric neutron conditions
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[0041] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, and do not limit the protection scope of the present invention.
[0042] see figure 1 As shown, it is a schematic flow chart of an embodiment of the method for predicting the failure rate of electronic devices induced by atmospheric neutrons in the present invention. The method for predicting the failure rate of electronic devices induced by atmospheric neutrons in this embodiment includes the following steps:
[0043] Step S110: Obtain the original failure rate of electronic devices induced by atmospheric neutrons in the test environment;
[0044] In this step, the atmospheric neutrons are radiation particles with high content in the...
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The invention relates to a method and system for predicting the failure rate induced by atmosphere neutrons of an electronic device, and belongs to the field of radiation effect of the electronic device. An original failure rate induced by atmosphere neutrons of the electronic device in a test environment is obtained; the atmosphere neutron flux of the test environment and the atmosphere neutron flux of a target environment are obtained; a proportion factor of the atmosphere neutron fluxes is obtained according to the atmosphere neutron fluxes of the test and target environments; and a targetfailure rate induced by atmosphere neutrons of the electronic device in the target environment can obtained according to the original failure rate and the proportion factor of the atmosphere neutron fluxes. The obtaining process is simple and efficient, the process of analyzing radiation sensitive characteristics of the electronic device in the atmosphere neutron condition is simplified, the single particle effect sensitivity of the electronic device in the atmosphere neutron condition is evaluated quantitatively, and the problem that a single particle effect evaluation method of the electronic device in the atmosphere neutron condition lacks domestically is solved.
Description
technical field [0001] The invention relates to the field of radiation effects of electronic devices, in particular to a method and system for predicting the failure rate of electronic devices induced by atmospheric neutrons. Background technique [0002] Various cosmic rays such as galactic cosmic rays and solar cosmic rays enter the earth's neutral atmosphere and interact with nitrogen and oxygen in the atmosphere to form various radiation particles, making the atmospheric radiation environment very complex. Among all kinds of radiation particles, since neutrons are uncharged, extremely penetrating and have a high content in the atmosphere, the single event effect caused by atmospheric neutrons entering the electronic system has become the key to threatening the safe operation of electronic equipment. factor. [0003] At present, in order to analyze the radiation sensitivity characteristics of electronic devices under atmospheric neutron conditions, a series of atmospheri...
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Login to View More IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 张战刚雷志锋何玉娟彭超师谦黄云恩云飞
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST