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Phase error correction method for out-of-focus phenomenon of fringe projection three-dimensional measuring system

A technology of three-dimensional measurement and phase error, which is applied in the direction of measuring devices, instruments, and optical devices, etc., can solve the problems that cannot be used to solve phase errors, projectors cannot accurately project, etc., and achieve the effect of simple algorithm implementation process

Active Publication Date: 2018-06-15
SOUTHEAST UNIV
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AI Technical Summary

Problems solved by technology

However, industrial projectors cannot accurately project stripes with very small stripe widths. For example, for common projectors, when the projection stripe width is less than 8 pixels, the projector often cannot accurately project
Therefore, this type of method cannot be used to solve the phase error caused by camera defocus in the FPP system

Method used

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  • Phase error correction method for out-of-focus phenomenon of fringe projection three-dimensional measuring system
  • Phase error correction method for out-of-focus phenomenon of fringe projection three-dimensional measuring system
  • Phase error correction method for out-of-focus phenomenon of fringe projection three-dimensional measuring system

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Embodiment 1

[0047] The present invention will be further explained below in conjunction with the accompanying drawings and specific embodiments. Under the Windows operating system, MATLAB is selected as the programming tool to process the sinusoidal fringes generated by the computer and the fringe images collected by the CCD camera. In this example, a white plane with black texture is used as the measured object, which proves the validity of the error correction method proposed in this patent. It should be understood that these examples are only used to illustrate the present invention and are not intended to limit the scope of the present invention. After reading the present invention, those skilled in the art all fall within the appended claims of the present application to the modifications of various equivalent forms of the present invention. limited range.

[0048] A phase error correction method for the defocus phenomenon of the fringe projection three-dimensional measurement syste...

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Abstract

The invention discloses a phase error correction method for an out-of-focus phenomenon of a fringe projection three-dimensional measuring system. The method comprises: a computer generates a phase-shifted fringe image and the image is collected by a camera; for the collected image, a background image I' and a phase phi' containing an error are calculated and edge extraction is carried out on the background image I'; a point spread function (PSF) of each edge pixel is calculated after edge map obtaining; a phase gradient direction and a phase density of each to-be-processed pixel are calculatedby using gradient filtering and neighborhood averaging methods in the phase map phi'; and then for the to-be-processed pixels, phase errors delta phi caused by the out of focus of the camera are calculated pixel by pixel, so that a finally corrected phase phi is obtained and the phi meets a formula: phi=phi'-delta phi. The corrected phase information can be converted into three-dimensional information of a to-be-measured object by a phase-height mapping relationship.

Description

Technical field: [0001] The invention belongs to the field of three-dimensional reconstruction in computer vision, and in particular relates to a phase error correction method for the defocus phenomenon of a fringe projection three-dimensional measurement system. Background technique: [0002] The three-dimensional measurement technology FPP (fringe projection profilometry) based on fringe projection has been extensively researched and applied in recent years because of its advantages of high precision, fast speed, and little influence from ambient light. As a three-dimensional measurement method based on active light projection, FPP also has corresponding limitations. In the active light projection technology, it is often assumed that a certain object point on the surface of the object to be measured only directly receives the illumination from the sensor of the projection device. This assumption does not hold in many practical situations. In addition to directly receivin...

Claims

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Application Information

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IPC IPC(8): G01B11/25
CPCG01B11/2504G01B11/254G01B11/25
Inventor 达飞鹏饶立
Owner SOUTHEAST UNIV
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