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Low temperature and high voltage test platform device for superconducting samples

A test platform and high-voltage technology, which is used in measurement devices, material breakdown voltage, and material analysis by electromagnetic means. It can not truly reflect the comprehensive characteristics of superconducting materials, etc., so as to achieve the effect of uncomplicated processing, easy realization, and easy installation and transportation.

Active Publication Date: 2019-11-15
BEIJING JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the prior art, cryogenic containers used for testing superconducting materials or devices and components cannot simultaneously provide test conditions such as variable temperature, variable pressure, low temperature and high voltage insulation, fault current impact, and the influence of gas-liquid relative insulation.
Since the individual tests of the above items cannot provide the change rule under the simultaneous action of multiple conditions, and cannot truly reflect the comprehensive characteristics of superconducting materials, superconducting devices or components under external conditions, it adds complexity to the research and development of superconducting power devices. Reduced the support effectiveness of test data for equipment development

Method used

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  • Low temperature and high voltage test platform device for superconducting samples
  • Low temperature and high voltage test platform device for superconducting samples
  • Low temperature and high voltage test platform device for superconducting samples

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Embodiment 1

[0074] The embodiment of the present invention provides a low-temperature and high-voltage test platform device for superconducting samples. In addition to realizing the high-voltage impact test of high-temperature superconducting coil samples, the device can also provide variable temperature, variable pressure, low temperature and high voltage. Insulation, fault current impact, influence of gas-liquid two-phase insulation and other test conditions. The present invention can provide test conditions for the influence of air bubbles in liquid nitrogen on the above-mentioned various tests. The embodiment of the present invention can also record the conditions of liquid nitrogen and superconducting samples in various test processes in detail by connecting peripheral imaging equipment.

[0075] The overall appearance of a low-temperature high-voltage test platform device for superconducting samples provided by the embodiment of the present invention is as follows figure 1 As shown...

Embodiment 2

[0136] This embodiment provides a low-temperature and high-voltage test platform device for superconducting samples, and the present invention is further described in detail with reference to the accompanying drawings as follows:

[0137] An isometric view of the overall appearance of a low-temperature and high-voltage test platform device for a superconducting sample provided by an embodiment of the present invention is as follows: figure 1 As shown, the Dewar body 1, the Dewar cover 2 and the movable support base 3 in the embodiment of the present invention are all made of stainless steel. The middle and lower part of the Dewar body 1 has a transparent window 4, which adopts sapphire glass. The sapphire glass is bonded to the Dewar body with epoxy glue. There are high-voltage leads 5 with insulating sleeves, current leads 6, aviation sockets 7 and earrings 11 for hoisting on the Dewar cover. A pressure gauge 8 for monitoring the internal pressure of the dewar body 1 and a ...

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Abstract

The embodiment of the invention provides a low-temperature high-voltage test platform device for a superconducting sample. The device comprises a Dewar main body, a Dewar cover, a support base, a highvoltage lead, a current lead, a pressure gauge, a liquid nitrogen valve, a pipe, a transparent window and a support platform. The Dewar cover is placed on the top of the Dewar main body. The high voltage lead and the current lead are drawn from the Dewar cover. The pressure gauge, the liquid nitrogen valve and the pipe are located on the Dewar main body. The transparent window is located in the lower-middle part of the Dewar main body. The support base is placed on the bottom of the Dewar main body. The support platform is arranged in the Dewar main body and is connected to the Dewar cover. The Dewar cover, the Dewar main body and the support base are connected in a seal way. A superconducting sample is arranged on the support platform. Through the transparent window, the physical phenomenon of the superconducting sample in the Dewar main body is observed in a test. The low-temperature high-voltage test platform device has a simple structure, a reasonable design and flexible arrangement, and can meet the needs of various experimental conditions for superconducting samples.

Description

technical field [0001] The invention relates to the technical field of high-temperature superconductivity test, in particular to a low-temperature and high-voltage test platform device for superconducting samples. Background technique [0002] Superconducting materials have unique properties such as zero resistance characteristics, complete diamagnetism, and rapid resistance transition characteristics at critical values, and have broad application value. With the rapid development and commercial supply of high-temperature superconducting materials in recent years, the research on superconducting power technology is rapidly expanding around the world. The fields involved in the research and development of superconducting materials include: high-temperature superconducting current limiters, high-temperature superconducting transformers, high-temperature superconducting cables, and superconducting energy storage systems. [0003] Superconducting devices must operate in a safe ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N27/00G01N27/92
CPCG01N27/00G01N27/92
Inventor 戴少涛闫旭锋王邦柱马韬胡磊张腾
Owner BEIJING JIAOTONG UNIV