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LCD (liquid crystal display) quality check method and device, CIM (computer integrated manufacturing) system and computer storage medium

A computer storage and quality inspection technology, applied in the field of LCD quality inspection, can solve the problems of easy misjudgment and other problems, achieve the effect of improving the detection rate, saving labor and time costs, and reducing the misjudgment rate

Active Publication Date: 2018-06-29
WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main purpose of the present invention is to provide an LCD quality inspection method, device, CIM system and computer storage medium, aiming to solve the technical problem that the existing manual LCD quality inspection method is prone to misjudgment

Method used

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  • LCD (liquid crystal display) quality check method and device, CIM (computer integrated manufacturing) system and computer storage medium
  • LCD (liquid crystal display) quality check method and device, CIM (computer integrated manufacturing) system and computer storage medium
  • LCD (liquid crystal display) quality check method and device, CIM (computer integrated manufacturing) system and computer storage medium

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Embodiment Construction

[0038] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0039] The main solutions of the embodiments of the present invention are: to obtain the process parameters of the LCD to be inspected; to determine the similarity between the process parameters of the LCD to be inspected and the pre-stored historical process parameters; based on the similarity, combined with the pre-stored The quality inspection results corresponding to the historical process parameters are matched with the quality inspection results corresponding to the LCD to be inspected; from the matched quality inspection results, the quality inspection results that meet the preset conditions are extracted as the LCD to be inspected predicted quality inspection results.

[0040] Such as figure 1 as shown, figure 1 It is a schematic diagram of the structure of the terminal to which the device of the hardware op...

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Abstract

The invention discloses an LCD quality check method, comprising: acquiring process parameters of an LCD under check; determining similarity between the process parameters of the LCD under check and historical process parameters that are pre-stored; matching quality check results corresponding to the LCD under check based on the similarity in conjunction with quality check results corresponding tothe historical process parameters that are prestored; extracting from the matched quality check results, quality check results meeting preset conditions to act as predictive quality check results forthe LCD under check. The invention also discloses an LCD quality check device, a CIM (computer integrated manufacturing) system and a computer storage medium. The LCD quality check method and device,the CIM system and the computer storage medium can save manpower and time costs, and can provide increased optical defect detection rate for LCD products and reduced misjudgment upon an optical defect.

Description

technical field [0001] The invention relates to the technical field of LCD quality inspection, in particular to an LCD quality inspection method, device, CIM system and computer storage medium. Background technique [0002] LCD (Liquid Crystal Display) liquid crystal display has the advantages of low power consumption, small size, zero radiation, etc., and is widely used in the screen display of PCs, TVs, mobile terminals and other equipment. In order to ensure the display function of the LCD, after the LCD is produced, it needs to be inspected for quality. At present, the quality inspection of LCD is realized by manually inspecting the screen and appearance of the LCD, and multiple screens need to be inspected. This process mainly depends on the experience of the quality inspectors and the acuity of the naked eye, which is likely to cause misjudgment and misjudgment of poor optics. Misjudgments such as missed judgments. [0003] The above content is only used to assist in...

Claims

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Application Information

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IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 张永易郑颖博
Owner WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
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