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Double-height illumination FPM (Fourier ptychographic microscopy) imaging method

A microscopic imaging, double-height technology, applied in the optical field, can solve the problems of reducing the field of view, unable to obtain phase contrast images, etc., to increase the overlap rate and data redundancy, improve the imaging accuracy and convergence speed. , to ensure the effect of frequency domain size and final resolution

Active Publication Date: 2018-08-03
BEIJING UNIV OF TECH
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Problems solved by technology

[0002] Optical microscopes play a huge role in biomedical testing, but traditional optical microscopes have two defects: first, the phase contrast image of the sample cannot be obtained; second, when the resolution is increased, the field of view is greatly reduced

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  • Double-height illumination FPM (Fourier ptychographic microscopy) imaging method

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Embodiment Construction

[0028] Such as figure 1As shown, a double-height illumination Fourier stack microscopic imaging method is characterized in that: a double-height illumination Fourier stack microscopic imaging method, the optical path of the imaging system includes a spiral height adjustment frame 1, 32x32 light emitting Unit LED array 2, tested sample 3, microscope objective lens (4×, 0.1NA) 4, imaging lens 5, scientific grade sCMOS camera 6, microscope 7. The screw height adjustment frame 1 is used to fix the LED array 2 of the 32x32 light-emitting unit and adjust the lighting height h of the LED array 2 1 , h 2 The LED array 2 of the 32x32 light-emitting unit lights up the light-emitting unit sequentially to provide illumination light at different angles for the tested sample 3, the distance between the light-emitting units is 5mm, and the wavelength is 625nm; the tested sample 3 is placed in the LED array 2 and the display Between the micro-objective lens 4, it is on the focal plane of th...

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Abstract

The invention discloses a double-height illumination FPM (Fourier ptychographic microscopy) imaging method and belongs to the technical field of optics. An imaging system light path for realizing themethod comprises a spiral height adjusting bracket, an LED array, a to-be-tested sample, a microobjective, an imaging lens, a camera and a microscope. The distance between the sample and an LED planeis changed, reconstruction iteration is performed on low-resolution intensity images recorded at two heights in the sequential increase sequence of illumination incidence angles, so that the samplingrate of a low-frequency part can be increased, the overlapping rate and data redundancy in a low-frequency area in the frequency spectrum can be effectively increased under the condition that other imaging system parameters are kept unchanged, and the imaging precision and the convergence rate of FPM are further increased.

Description

technical field [0001] The invention relates to a method for double-height illumination Fourier stack microscopic imaging, in particular to a method for improving imaging precision and convergence speed by double-plane illumination Fourier stack, and belongs to the field of optical technology. Background technique [0002] Optical microscopes play a huge role in biomedical testing, but traditional optical microscopes have two shortcomings: first, they cannot obtain phase contrast images of samples; second, when the resolution increases, the field of view is greatly reduced. The Fourier Ptychographic Microscopy (FPM) imaging system based on light-emitting diode (Light Emitting Diode, LED) array illumination is modified on the basis of traditional optical microscope. Two-dimensional thin samples are obtained from different angles. With plane wave illumination, the spectrum of the sample on the back focal plane of the objective lens is translated to different corresponding posi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G01N21/27
CPCG01N21/01G01N21/27
Inventor 戎路王大勇唐超赵洁王云新王红红
Owner BEIJING UNIV OF TECH
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