Three-dimensional topography measurement method capable of inhibiting indirect illumination

Abstract

The present invention relates to a three-dimensional topography measurement method capable of inhibiting indirect illumination which can perform complete and high-precision three-dimensional measurement in a condition of indirect illumination, belonging to the optical measurement field. The three-dimensional topography measurement method is based on a structural light three-dimensional topographymeasurement system which is mainly formed by a projector and a camera. The projector and the camera form a binocular stereoscopic visual system. The three-dimensional topography measurement method employs a polar line geometric principle in the binocular stereoscopic vision, and the polar line geometry can determine the corresponding relation of the projector and the upper polar line of the camera. In the measurement process, a complete structural light pattern is subjected to multi-time projection, each projection only project one polar line in a geometrical relationship of the projector andthe camera polar line. Direct illumination be reflected only once, and an emitting point is located on a corresponding polar line of a camera image; most of indirect illumination is subjected to multi-time reflection or scattering, and be no longer emitted from the corresponding polar line of the camera image. When pixels of the corresponding polar line of the camera image is only retained, the indirect illumination is inhibited so as to avoid influence of the indirect illumination on three-dimensional topography measurement.

Description

technical field [0001] The invention relates to a three-dimensional shape measurement method capable of suppressing indirect illumination, which can perform complete and high-precision three-dimensional shape measurement under the condition of indirect illumination, and belongs to the field of optical measurement. Background technique [0002] Optical three-dimensional shape measurement technology has the characteristics of non-contact, fast speed, and high precision. In recent years, with the continuous development of related technologies, its application fields have become more extensive, including processing quality control in manufacturing, digital protection of cultural relics and ancient buildings, etc. . [0003] Structured light technology is a common optical three-dimensional shape measurement method. A projector is used to project a structured light pattern, and a camera is used to capture the structured light pattern modulated by the surface of an object. The patt...

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Problems solved by technology

[0005] The invention proposes a three-dimensional shape measurement method capable of suppressing indirect illumination, which can solve the problems of missing measurement data and decreasing precision caused by indirect illumination

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