EEMD (Ensemble Empirical Mode Decomposition) and HMM (Hidden Markov Model) based analog circuit intermittent fault diagnosis method

An analog circuit and fault diagnosis technology, which is applied in analog circuit testing, CAD circuit design, electronic circuit testing, etc., can solve problems such as circuit intermittent faults, and achieve the effects of avoiding misidentification, accurate identification, and good identification effect

Active Publication Date: 2018-09-14
CHONGQING UNIV
View PDF4 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Each integrated circuit contains thousands of electronic components, and each

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • EEMD (Ensemble Empirical Mode Decomposition) and HMM (Hidden Markov Model) based analog circuit intermittent fault diagnosis method
  • EEMD (Ensemble Empirical Mode Decomposition) and HMM (Hidden Markov Model) based analog circuit intermittent fault diagnosis method
  • EEMD (Ensemble Empirical Mode Decomposition) and HMM (Hidden Markov Model) based analog circuit intermittent fault diagnosis method

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach

[0017] 1. Make the same analog circuit for testing according to the existing analog circuit system, the test circuit can perform fault injection operations on relevant nodes, use the sensitivity analysis method to analyze the test circuit, determine the key nodes in the test circuit, and install them corresponding relay. The specific implementation is as follows:

[0018] The operation of different components in the same circuit system has different effects on the entire circuit system. As long as the operation status of the key node components that affect the operation of the system is judged, the operation of the entire system can be roughly judged. Sensitivity analysis is a method to study and analyze the parameter changes of system components and the state or output sensitivity of a system. Through sensitivity analysis, it can be judged which components have a greater impact on the circuit system, and these key node components are studied, namely The overall state of the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an EEMD (Ensemble Empirical Mode Decomposition) and HMM (Hidden Markov Model) based analog circuit intermittent fault diagnosis method. The specific steps of the method are asfollows: manufacturing a same analog circuit for testing according to the existing analog circuit system, obtaining a key node on a test circuit through sensitivity analysis, and installing a relay for the key node, wherein the closing frequency of the relay is set to two modes: a fixed frequency for simulating the periodic intermittent fault and a random closing frequency for simulating the random intermittent fault. The operation state of the intermittent fault of the circuit system is simulated by controlling the intermittent closing of the key-node relay, so that sample data of the test circuit are obtained, the EEMD processing and the feature extraction are conducted on the acquired sample data to construct an energy feature matrix, the different states of HMMs are trained by using the feature matrix, the well trained HMM is used to identify and classify the acquired signal data of the existing analog circuit, and the fault type of the signal of the existing analog circuit systemis efficiently accurately identified.

Description

technical field [0001] The invention relates to the technical field of intermittent fault diagnosis of analog circuits, in particular to a method for diagnosing intermittent faults of analog circuits based on EEMD and HMM. Background technique [0002] Intermittent failure of the electrical system refers to a failure that lasts for a limited period of time, without any corrective maintenance activities, and then restores its ability to perform the required function by itself. Intermittent failure is an intermittent, unpredictable physical phenomenon that appears and disappears randomly. Repeated appearance and disappearance are mainly caused by internal system defects (unstable hardware and software), and whether it occurs or not depends on certain specific system conditions. During the active period of intermittent faults, the system will produce wrong results; when intermittent faults are inactive, the system will output correct results, and the cause of the fault is usua...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/316G06F17/50
CPCG01R31/316G06F30/36
Inventor 屈剑锋贺孝言肖晨范滨淇
Owner CHONGQING UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap