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Methods used to align the spectrometer

A spectrometer, instrument technology, applied in the field of aligning spectrometers, to solve problems such as increased cost and complexity

Active Publication Date: 2021-07-27
UNIV OF WASHINGTON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Two-axis tilt correction is usually done with two sets of motorized micrometers, adding cost and complexity
Additionally, biaxial tilt correction may be required each time a particular CCA is used

Method used

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  • Methods used to align the spectrometer
  • Methods used to align the spectrometer
  • Methods used to align the spectrometer

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Embodiment Construction

[0025] As described above, one method of alignment error caused by the crystal analyzer formed by misuse chip is to use biaxial tilt correction. Other methods for reducing alignment errors are disclosed herein. These methods involve rotating the crystal analyzer rotates around the axis within the instrument plane of the spectrometer (eg, Roland). By finding the maximum intensity of the diagnostic signal corresponding to the respective rotational positions of the crystal analyzer, the chase of the crystal analyzer can be determined in the first rotational position in the instrument plane. Alternatively, by finding the minimum intensity of the diagnostic signal corresponding to the respective rotational positions of the crystal analyzer, the second rotational position can be determined, at the second rotational position, the projection of the torched lattice vector on the rotating plane is perpendicular to the instrument. flat.

[0026] Starting from the first rotating position, the...

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Abstract

Exemplary methods for aligning spectrometers are described herein. The spectrometer includes a radiation source, a crystal analyzer, and a detector, all located in the instrument plane. The method includes rotating the crystal analyzer about an axis in the instrument plane and perpendicular to the plane of rotation such that (i) the reciprocal lattice vector of the crystal analyzer is in the instrument plane, or ( ii) The component of the reciprocal lattice vector in the plane of rotation is perpendicular to the instrument plane. The origin of the reciprocal lattice vectors lies on the axis. The method also includes tilting the crystal analyzer or translating the detector such that the reciprocal lattice vector bisects a line segment bounded by the detector and the radiation source. Exemplary spectrometers associated with the exemplary methods are also disclosed.

Description

[0001] Cross-reference [0002] The claims of the US Temporary Patent Application No. 62 / 271,992, filed on December 28, 2015, which are incorporated herein by reference in its entirety. [0003] Notice on federal funding research or development [0004] The present invention is completed under a contract number DE-FG02-09ER16106 and DE-SC0008580 granted by the US Department of Energy. The Government has a certain right to the invention. Technical field Background technique [0005] Unless otherwise indicated here, the material described in this section is not a prior art according to the claims in the present application, and although included in this portion but is not recognized as prior art. [0006] Many X-ray spectrometers use a curved crystal analyzer (CCA) to monochromalyize X-rays to irradiate the sample or emission monochromaticized from the sample or transmitted the sample. CCA is typically manufactured by glueing Si or GE wafer or in conjunction in a concave glass len...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/02G01N23/20008G01N23/207G01N21/63G02F1/355
CPCG21K1/06G01N23/2076G21K2201/062G21K2201/067G01N23/20083G01N23/20016G21K2201/06G21K2201/064G01N23/20G01N23/20091G01N23/207G01N23/22G01N23/20008
Inventor D·R·莫滕森G·T·塞德勒
Owner UNIV OF WASHINGTON
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