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A method and device for measuring transient deformation

A transient and measuring head technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problem of long measurement time of periodic transient deformation, achieve the effect of reducing measurement time and improving measurement speed

Active Publication Date: 2020-07-24
吴思进
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The embodiment of the present application provides a transient deformation measurement method and device to solve the existing problem of long measurement time of periodic transient deformation

Method used

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  • A method and device for measuring transient deformation
  • A method and device for measuring transient deformation
  • A method and device for measuring transient deformation

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Embodiment 1

[0051] figure 1 It is a schematic flowchart of a transient deformation measurement method provided in the embodiment of the present application. The method can be as follows.

[0052] Step 102: The laser emits laser light to irradiate the measured object, wherein the measured object exhibits periodic transient deformation.

[0053] Step 104: The speckle interference probe receives the reflected light reflected by the measured object, and forms speckle interference according to the reflected light.

[0054] Step 106: The speckle interferometric probe outputs a set of speckle interferograms collected according to a preset time sequence, wherein the set of speckle interferograms is obtained by sampling each position on the time axis within the transient deformation period.

[0055] In the embodiment of the present application, the speckle interferometric probe is a shearing speckle interferometric probe.

[0056] It should be noted that the speckle interferometric probe can be...

Embodiment 2

[0109] Figure 5 It is a schematic structural diagram of a transient deformation measuring device provided in the embodiment of the present application. Figure 5 The illustrated apparatus 500 includes:

[0110] The laser 501 is used to emit laser light to irradiate the measured object, wherein the measured object exhibits periodic transient deformation;

[0111] The speckle interference measuring head 502 is used to receive the reflected light reflected by the measured object, and form speckle interference according to the reflected light;

[0112] The speckle interferometric probe 502 is also used to output a set of speckle interferograms collected according to a preset time sequence, wherein the set of speckle interferograms is obtained by sampling each position on the time axis within the transient deformation period ;

[0113] The image processing module 503 is configured to determine, according to the set of speckle interferograms, a deformation position and / or a defo...

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Abstract

The present application discloses a transient deformation measuring method and device. The transient deformation measuring method includes that: a laser emits laser to illuminate a measured object, wherein the measured object exhibits periodic transient deformation; a speckle interference probe receives the reflected light reflected by the reflected object, and forms speckle interference accordingto the reflected light; the speckle interference probe outputs a speckle interferogram set acquired according to a preset timing sequence, wherein the speckle interferogram set is acquired by sampling each position on a time axis in the transient deformation period; an image processing module determines a deformation position and / or a deformation variable of the transient deformation of the measured object in the transient deformation period according to the speckle interferogram set. The method can measure the periodic transient deformation by sampling the speckle interferogram at each position on the time axis in the transient deformation period, and can effectively improve the measurement speed and reduce the measurement time.

Description

technical field [0001] The present application relates to the technical field of full-field optical testing, in particular to a method and device for measuring transient deformation. Background technique [0002] For the measurement of periodic dynamic deformation, the stroboscopic lighting method is usually used. For example, in the process of vibration measurement, the laser strobe illumination is realized by modulating the laser, and the frequency of the output strobe laser is consistent with the vibration frequency, so that the illumination is locked on a certain phase of the vibration. The phase diagrams in two different states are respectively obtained by the stroboscopic lighting method, and then subtracted to obtain the phase difference distribution corresponding to the displacement distribution of the measured object, and then the spatial distribution of the vibration amplitude is obtained. [0003] However, for periodic transient deformation (that is, an instantan...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/16
CPCG01B11/16
Inventor 吴思进马国峰
Owner 吴思进