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A kind of surface plasmon enhanced semiconductor active device and its manufacturing method

A surface plasmon, active device technology, applied in semiconductor devices, electrical components, circuits, etc., to achieve the effect of improving internal quantum efficiency and improving quantum efficiency

Active Publication Date: 2020-05-22
XI AN JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The present invention solves the problem of using surface plasmon technology to improve the internal quantum efficiency of semiconductor active devices, especially for the yellow-green light band and deep ultraviolet band with low luminous efficiency at present, and may be used for red light that cannot be effectively realized by using InGaN materials. and infrared bands, providing a surface plasmon-enhanced semiconductor active device and a manufacturing method thereof

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  • A kind of surface plasmon enhanced semiconductor active device and its manufacturing method
  • A kind of surface plasmon enhanced semiconductor active device and its manufacturing method

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Experimental program
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Effect test

Embodiment 1

[0036] The manufacturing method of the surface plasmon semiconductor active device according to the embodiment of the present invention is specifically as follows:

[0037] Step S1, making the epitaxial structure required by the present invention. The epitaxial substrate is a kind of in Si substrate, SiC substrate, ALN substrate, GaN substrate or sapphire substrate, adopts the epitaxial technology such as MOCVD technology or MBE technology, epitaxially grows on the described substrate required by the present invention. epitaxial structure. In this embodiment, the GaN material is epitaxially grown by MOCVD on a sapphire substrate. The thickness of the first semiconductor layer 100 is 3um-6um, the active layer 300 is a multi-quantum well structure, the number of multi-quantum well periods is 10-15, the radiation wavelength is 450nm-460nm, and the thickness of the main part 201 of the second semiconductor layer is 100nm- 200nm, the number of quantum well periods in the multi-qu...

Embodiment 2

[0046] The manufacturing method of the surface plasmon semiconductor active device according to the embodiment of the present invention is specifically as follows:

[0047] Step S1, making the epitaxial structure required by the present invention. The epitaxial substrate is a kind of in Si substrate, SiC substrate, ALN substrate, GaN substrate or sapphire substrate, adopts the epitaxial technology such as MOCVD technology or MBE technology, epitaxially grows on the described substrate required by the present invention. epitaxial structure. In this embodiment, the GaN material is epitaxially grown by MOCVD on a sapphire substrate. The thickness of the first semiconductor layer 100 is 3um-6um, the active layer 300 is a multi-quantum well structure, the number of multi-quantum well periods is 10-15, the radiation wavelength is 450nm-460nm, and the thickness of the main part 201 of the second semiconductor layer is 100nm- 200nm, the multi-quantum well layer 202 has 10 quantum we...

Embodiment 3

[0056] The manufacturing method of the surface plasmon semiconductor active device according to the embodiment of the present invention is specifically as follows:

[0057] Step S1, making the epitaxial structure required by the present invention. The epitaxial substrate is a kind of in Si substrate, SiC substrate, ALN substrate, GaN substrate or sapphire substrate, adopts the epitaxial technology such as MOCVD technology or MBE technology, epitaxially grows on the described substrate required by the present invention. epitaxial structure. In this embodiment, the AlGaN material is epitaxially grown by MOCVD on a sapphire substrate. The thickness of the first semiconductor layer 100 is 3um-6um, the active layer 300 is a multi-quantum well structure, the number of multi-quantum well periods is 5-10, the radiation wavelength is 280nm, the thickness of the main part 201 of the second semiconductor layer is 100nm-200nm, The number of quantum well periods in the multi-quantum well...

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Abstract

The invention relates to a surface plasmon enhancement semiconductor active device and a production method thereof. The active device comprises a matrix and a multi-layer semiconductor structure formed on the matrix; and the multi-layer semiconductor structure comprises a first semiconductor layer, an active layer, a second semiconductor layer and a surface plasmon coupling layer which are sequentially formed on the matrix, and a first electrode and a second electrode which are respectively in direct or indirect electrical connection with the first semiconductor layer and the second semiconductor layer. The method comprises the steps of: producing an epitaxy structure; producing a surface plasmon layer on the surface of a multi-quantum-well layer of the second semiconductor layer; producing the second electrode on the surface plasmon layer; exposing all or part of the first semiconductor layer to use as a contact layer for producing the first electrode; producing the first electrode atthe position of the exposed electrical contact layer of the first semiconductor layer; and producing a wavelength proportion selection film layer in a non-electrode region on the surface of the firstsemiconductor layer. According to the invention, broadband spectrum or multi-spectrum radiation and non-phosphor single-chip white light radiation are implemented.

Description

technical field [0001] The invention belongs to the technical field of semiconductors, in particular to a surface plasmon enhanced semiconductor active device and a manufacturing method thereof. Background technique [0002] Semiconductor optical radiation device technology has developed rapidly in recent years, which has had a significant impact on science and technology, industry and daily life. Among them, the semiconductor optical radiation device of the III-V compound semiconductor material system is the most prominent. Typical representative materials are AlN, GaN, InN and combined ternary or quaternary compounds. The theoretical band gap ranges from 6.2eV to 0.7eV. Radiation wavelengths can cover deep ultraviolet to infrared bands. At present, the InGaN / GaN series of blue-green LEDs have set off a revolution in lighting technology. Ultraviolet and ultraviolet LEDs based on AlGaN materials play a huge role in the fields of ultraviolet curing, ultraviolet sterilizatio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/00H01L33/06H01L33/20H01L33/32H01L33/50
CPCH01L33/0075H01L33/06H01L33/20H01L33/32H01L33/504
Inventor 云峰苏喜林李虞锋郭茂峰张敏妍张烨
Owner XI AN JIAOTONG UNIV