A kind of surface plasmon enhanced semiconductor active device and its manufacturing method
A surface plasmon, active device technology, applied in semiconductor devices, electrical components, circuits, etc., to achieve the effect of improving internal quantum efficiency and improving quantum efficiency
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Embodiment 1
[0036] The manufacturing method of the surface plasmon semiconductor active device according to the embodiment of the present invention is specifically as follows:
[0037] Step S1, making the epitaxial structure required by the present invention. The epitaxial substrate is a kind of in Si substrate, SiC substrate, ALN substrate, GaN substrate or sapphire substrate, adopts the epitaxial technology such as MOCVD technology or MBE technology, epitaxially grows on the described substrate required by the present invention. epitaxial structure. In this embodiment, the GaN material is epitaxially grown by MOCVD on a sapphire substrate. The thickness of the first semiconductor layer 100 is 3um-6um, the active layer 300 is a multi-quantum well structure, the number of multi-quantum well periods is 10-15, the radiation wavelength is 450nm-460nm, and the thickness of the main part 201 of the second semiconductor layer is 100nm- 200nm, the number of quantum well periods in the multi-qu...
Embodiment 2
[0046] The manufacturing method of the surface plasmon semiconductor active device according to the embodiment of the present invention is specifically as follows:
[0047] Step S1, making the epitaxial structure required by the present invention. The epitaxial substrate is a kind of in Si substrate, SiC substrate, ALN substrate, GaN substrate or sapphire substrate, adopts the epitaxial technology such as MOCVD technology or MBE technology, epitaxially grows on the described substrate required by the present invention. epitaxial structure. In this embodiment, the GaN material is epitaxially grown by MOCVD on a sapphire substrate. The thickness of the first semiconductor layer 100 is 3um-6um, the active layer 300 is a multi-quantum well structure, the number of multi-quantum well periods is 10-15, the radiation wavelength is 450nm-460nm, and the thickness of the main part 201 of the second semiconductor layer is 100nm- 200nm, the multi-quantum well layer 202 has 10 quantum we...
Embodiment 3
[0056] The manufacturing method of the surface plasmon semiconductor active device according to the embodiment of the present invention is specifically as follows:
[0057] Step S1, making the epitaxial structure required by the present invention. The epitaxial substrate is a kind of in Si substrate, SiC substrate, ALN substrate, GaN substrate or sapphire substrate, adopts the epitaxial technology such as MOCVD technology or MBE technology, epitaxially grows on the described substrate required by the present invention. epitaxial structure. In this embodiment, the AlGaN material is epitaxially grown by MOCVD on a sapphire substrate. The thickness of the first semiconductor layer 100 is 3um-6um, the active layer 300 is a multi-quantum well structure, the number of multi-quantum well periods is 5-10, the radiation wavelength is 280nm, the thickness of the main part 201 of the second semiconductor layer is 100nm-200nm, The number of quantum well periods in the multi-quantum well...
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Abstract
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