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Kerr microscope

A technology of objective lens and mirror, applied in the field of Kerr microscope, can solve the problems of complex magnetic domain magnetization direction, time-consuming and laborious operation, difficult to meet accuracy requirements, etc., and achieve the effect of reducing mechanical instability

Inactive Publication Date: 2018-11-09
JINHUA VOCATIONAL TECH COLLEGE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Defect 1 of the prior art: The traditional Kerr microscope uses a mechanical mechanism to adjust the aperture slit to change the illuminated area on the sample, which is difficult to meet the accuracy requirements of the experiment; Defect 2 of the prior art: some special magnetic samples, which The magnetization direction of the magnetic domain is relatively complicated, and the resolution of the magnetic domain image obtained by the Kerr microscope of the prior art is low, and the position of the slit diaphragm needs to be changed many times to find suitable incident light conditions to obtain a higher image resolution , especially when studying the magnetoelastic properties of the sample, it is necessary to have different incident light intensities in different directions, and adjust the incident light intensity according to the obtained image quality, which is time-consuming, laborious and complicated to operate. The Kerr microscope can solve the problem question

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Embodiment Construction

[0030] Such as figure 1 is a schematic diagram of the present invention, such as figure 2 It is an enlarged schematic diagram of the side of the light source. There is an xy two-dimensional direction mark in the lower left corner. Device 5, aspheric mirror III 6, semi-transparent mirror 7, objective lens 8, laser 9, sample 10, sample stage 11, substrate 12, stepper motor 13, bevel stage 14, thimble 15, magnet 16, slit diaphragm 17 , photodetector I18, compensator 19, analyzer 20, aspheric mirror IV21, photodetector II22, the light source 1, aspheric mirror I2, aspheric mirror II3, field stop 4, polarizer 5, aspheric mirror III6 , semi-transparent mirror 7, and objective lens 8 form an illumination optical path in turn, and described objective lens 8, semi-transparent mirror 7, compensator 19, analyzer 20, aspheric mirror IV21 form imaging optical path in turn, and described laser 9, sample 10 surface , slit diaphragm 17, and photodetector I18 form a calibration optical path...

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Abstract

The invention relates to the field of magnetic measurement of a material surface and discloses a Kerr microscope. The Kerr microscope comprises a light source, a first aspheric mirror, a second aspheric mirror, a view field diaphragm, a polarizer, a third aspheric mirror, a semi-transparent mirror, an objective lens, a laser, a sample, a sample table, a substrate, a stepping motor, an inclined table, a thimble, a magnet, a slit diaphragm, a first photodetector, a compensator, an analyzer, a fourth aspheric mirror and a second photodetector, wherein the light source, the first aspheric mirror,the second aspheric mirror, the view field diaphragm, the polarizer, the third aspheric mirror, the semi-transparent mirror and the objective lens sequentially form a lighting path; the objective lens, the semi-transparent mirror, the compensator, the analyzer and the fourth aspheric mirror sequentially form an imaging light path; and the laser, the sample surface, the slit diaphragm and the firstphotodetector form a calibration light path. The phenomenon that a lighting area on the sample is changed by a diaphragm slit is not needed, the Kerr sensitivities in different directions are measured, and through adjusting the turning-on number of LED lamps and the lasting time, an image with good resolution is acquired.

Description

technical field [0001] The invention relates to the field of magnetic measurement of material surfaces, in particular to a Kerr microscope using a special light source and a magnet structure. Background technique [0002] The magneto-optical Kerr effect measurement device is an important means in the study of material surface magnetism. Its working principle is based on the magneto-optic Kerr effect caused by the interaction between light and magnetized media. Magnetic detection, and non-contact measurement can be realized, and it has important applications in the research of magnetic order, magnetic anisotropy, interlayer coupling and phase transition behavior of magnetic ultrathin films. Kerr microscope is a commonly used device. Its working principle is: after plane polarized light interacts with the surface of a non-transparent magnetic medium, the polarization plane of the reflected light rotates clockwise or counterclockwise, and its rotation direction is the same as t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/12G01R33/032
CPCG01R33/1292G01R33/0325
Inventor 张向平方晓华赵永建
Owner JINHUA VOCATIONAL TECH COLLEGE
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