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30results about "Domain wall position/motion measurement" patented technology
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Information storage devices using magnetic domain wall movement and methods of operating the same
Owner:SAMSUNG ELECTRONICS CO LTD
Methods and devices for using multi-turn magnetic sensors with extended magnetic windows
ActiveUS20190383643A1Steering partsConverting sensor output electrically/magneticallyMagnetic fieldNuclear magnetic resonance
Owner:ANALOG DEVICES INT UNLTD
Information storage devices using magnetic domain wall movement and methods of operating the same
An information storage device includes a storage node, a write unit configured to write information to a first magnetic domain region of the storage node, and a read unit configured to read information from a second magnetic domain region of the storage node. The information storage device further includes a temporary storage unit configured to temporarily store information read by the read unit, and a write control unit electrically connected to the temporary storage unit and configured to control current supplied to the write unit. The information read from the second magnetic domain region is stored in the temporary storage unit and written to the first magnetic domain region.
Owner:SAMSUNG ELECTRONICS CO LTD
Domain wall movement on magnetic strip tracks
InactiveUS20100090687A1Accurate measurementUsing electrical meansDigital storageA domainRotating magnetic field
Magnetic shift tracks or magnetic strips, to which application of a rotating magnetic field or by rotation of the strip itself allows accurate determination of domain wall movement. One particular embodiment is a method of determining a position of a domain wall in a magnetic strip. The method includes applying a rotating magnetic field to the magnetic strip, the magnetic field rotating around a longitudinal axis of the magnetic strip, and after applying the magnetic field, determining a displacement of the domain wall to a second position.
Owner:SEAGATE TECH LLC
Initialization state determination of a magnetic multi-turn sensor
InactiveUS20190383645A1NanomagnetismConverting sensor output electrically/magneticallyComputer science
Owner:ANALOG DEVICES INT UNLTD
Magnetization measurement method in complex magnetic domain
ActiveCN108957370AShort measurement timeNo complex calibration process requiredDomain wall position/motion measurementVisual field lossPolarizer
The invention relates to a magnetization measurement method in the complex magnetic domain, and relates to the field of material surface magnetization measurement. The magnetization measurement methodincludes a vertical Kerr sensitivity measurement method and a pure polar Kerr sensitivity measurement method. A measuring device mainly comprises a light source, a polarizer, a first dichroic mirror,a first aspheric mirror, a visual field diaphragm, a second aspheric mirror, a semi-transparent reflector, an object lens, a sample, a sample bench, a magnet, a compensator, a polarization analyzer,a second dichroic mirror, a third aspheric mirror, a first photoelectric detector, a fourth aspheric mirror and a second photoelectric detector. A bicolor LED lamp array serves as the light source, anillumination area on the sample can be changed needless of a diagram slit, two imaging optical paths can be used, a magnetic-domain image with different magnetization vector components can be obtained without change of the device structure, a magnetization vector image can be obtained directly in real time, measurement time is shorter, the measurement method of the invention is especially suitable for research complex magnetization conversion in a magnetic film structure, complex calibration is not needed, and the operation flow is simple.
Owner:JINHUA VOCATIONAL TECH COLLEGE
Magnetic domain measurement device for magnetic wires
InactiveCN108414451AHigh resolutionThe operation process is simple and convenientPolarisation-affecting propertiesDomain wall position/motion measurementMeasurement deviceWhite light
The invention relates to the field of material magnetic domain measurement and especially relates to a magnetic domain measurement device for magnetic wires. The magnetic domain measurement device comprises a laser, an optical filter I, a prism polarizer, a white light source, a beam splitter I, a beam splitter II, a 1 / 2 wave plate, a 1 / 4 wave plate, a beam splitter III, a camera, an aspherical mirror I, an optical filter II, a Wollaston prism, a photoelectric detector I, a photoelectric detector II, a displacement bench, an objective lens, an aspherical mirror II, a sample, a sample tube, a pick-up coil set, a magnet, a pre-amplifier, an oscilloscope and a computer. A polarizing angle of laser emitted by the laser is set as 45 degrees; when a polarizing angle of the prism polarizer is setas 0 degree, a beam is S polarization; when a polarizing angle of the prism polarizer is set as 90 degrees, the beam is P polarization; a rotating angle setting condition of the 1 / 2 wave plate is that a proportion of the S polarization to the P polarization after reflection light on the surface of a nonmagnetic sample passes through the 1 / 2 wave plate is 1 to 2; the 1 / 4 wave plate can be used formeasuring kerr ellipticity to obtain magnetized three-dimensional vector diagrams and research spread magnetic domain wall shapes.
Owner:JINHUA VOCATIONAL TECH COLLEGE
Shield magnetic saturation performance test device and method in low-frequency pulsed high magnetic field environment
PendingCN108387854AEasy to detectEfficient measurementMagnetisation measurementsSusceptibility measurementsMeasurement deviceControl system
Owner:UNIT 61489 OF PLA
Image acquisition system and image acquisition method
ActiveUS11163974B2Easy to measureMaterial analysis using wave/particle radiationImage memory managementLarge rangeAtomic physics
In an image acquisition system, a distortion distribution is easily measured in a wide range. A standard image of magnetic domain of a sample serving as a standard is acquired by radiation of light using a standard external magnetic field which serves as a standard, a plurality of magnetic domain images are acquired in a state where an external magnetic field is applied while being changed, a plurality of subtraction images obtained by subtracting the standard image of magnetic domain from each of the plurality of magnetic domain images are acquired, a magnetization reversal area in which a magnetic domain is reversed is extracted from each of the plurality of subtraction images, and a composite image having a plurality of magnetization reversal areas is acquired by compositing the plurality of subtraction images each having the magnetization reversal area.
Owner:HITACHI LTD
System and method for simultaneously observing oriented silicon steel crystalline grains and magnetic domains
ActiveCN108982336AReduce processing costsLess investmentIndividual particle analysisMeasurements of magnetic particlesSiliconDc voltage
The invention discloses a system and method for simultaneously observing oriented silicon steel crystalline grains and magnetic domains. A magnet yoke is formed by integrally molding a horizontal magnet yoke part, a left side vertical magnet yoke part and a right side vertical magnet yoke part, the horizontal magnet yoke part is wound with a magnet yoke body conductive wire, a DC voltage stabilizing power supply is used for powering the magnet yoke body conductive wire, an area formed by inner sides of the left side vertical magnet yoke part and right side vertical magnet yoke part as well asthe top of the horizontal magnet yoke part is a sample storage area, an oriented silicon steel sample can be arranged in the sample storage area, a magnetic fluid disc is arranged on the upper part ofthe oriented silicon steel sample, a power output end of an external power supply is connected with the input end of the voltage stabilizer, the output end of the voltage stabilizer is connected withan annular conductive wire of the magnetic fluid disc, the magnetic fluid disc provides a magnetic field along a normal of the silicon steel sample, and the magnet yoke provides a magnetic field along a rolling direction of the silicon steel sample. By adopting the system and method for simultaneously observing the oriented silicon steel crystalline grains and magnetic domains, the simultaneous observation of the oriented silicon steel crystalline grains and magnetic domains can be realized by virtue of a powder-pattern method.
Owner:武汉钢铁有限公司
Spin element and magnetic memory
ActiveUS20210364580A1Guaranteed uptimeOperational stability can be improvedMagnetic-field-controlled resistorsSolid-state devicesElectrical resistance and conductanceMagnetic memory
A spin element includes an element portion including a first ferromagnetic layer, a conducting portion that extends in a first direction as viewed in a lamination direction of the first ferromagnetic layer and faces the first ferromagnetic layer, and a current path extending from the conducting portion to a semiconductor circuit and having a resistance adjusting portion between the conducting portion and the semiconductor circuit, wherein the resistance value of the resistance adjusting portion is higher than the resistance value of the conducting portion, and the temperature coefficient of the volume resistivity of a material forming the resistance adjusting portion is lower than the temperature coefficient of the volume resistivity of a material forming the conducting portion.
Owner:TDK CORPARATION
Domain wall movement on magnetic strip tracks
InactiveUS8270204B2Accurate measurementUsing electrical meansDigital storageA domainRotating magnetic field
Owner:SEAGATE TECH LLC
High sensitive micro sized magnetometer
ActiveUS9857436B2Magnetic field measurement using galvano-magnetic devicesDomain wall position/motion measurementLow noisePeak value
The magnetometers possess detector part with a magnetic wire sensitive to magnetic field consisting of a domain structure of the surface domain with circular spin alignment and core domain with longitudinal spin alignment and micro coil surrounding its magnetic wire to pick up the change of longitudinal magnetizing caused by spin rotation in surface domain with circular spin alignment called as GSR effect excited by pulse with frequency of 0.5 GHz to 4 GHz. Peak coil voltage is detected by a circuit characterized with pulse generator, GSR element, Buffer circuit, sample holding circuit, amplifier circuit and means to invert it to external magnetic field. The induced coil voltage caused by parasitic coil capacitance and wiring loop is vanished by combination coil of right and left turn coil. The magnetometers can provide lower noise, wide measuring range with a small size detector part and is applied to smartphones, wearable computer and so on.
Owner:MAGNE DESIGN
Magnetoresistance effect element
ActiveUS20210286028A1Large MR ratioBig ratioMagnetic-field-controlled resistorsGalvano-magnetic material selectionAlloyMaterials science
A magnetoresistance effect element includes a first ferromagnetic layer, a second ferromagnetic layer, a first non-magnetic layer; and a second non-magnetic layer, wherein, the first ferromagnetic layer and the second ferromagnetic layer are formed so that at least one of them includes a Heusler alloy layer, the first non-magnetic layer is provided between the first ferromagnetic layer and the second ferromagnetic layer, the second non-magnetic layer is in contact with any surface of the Heusler alloy layer and has a discontinuous portion with respect to a lamination surface, and the second non-magnetic layer is made of a material different from that of the first non-magnetic layer and is a (001)-oriented oxide containing Mg.
Owner:TDK CORPARATION
Method of and apparatus for measuring magnitude of magnetization of perpendicular thin film
ActiveUS11193988B2Magnetisation measurementsMagnetic field offset compensationCondensed matter physicsMaterials science
Provided is a method of measuring a magnitude of magnetization of a perpendicular magnetic thin film, including: forming a stripe pattern in which a first magnetic domain that extends in a y direction and is magnetized in a z direction and a second magnetic domain that extends in the y direction and is magnetized in a direction opposite to the z direction are arranged alternately in an x direction, in a perpendicular magnetic thin film that extends in an xy plane; changing widths in the x direction, of the first and second magnetic domains by applying a magnetic field having a predetermined magnitude, in the z direction, to the perpendicular magnetic thin film; and calculating an absolute value of the magnetization of the perpendicular magnetic thin film on the basis of a ratio between the widths in the x direction, of the first magnetic domain and the second magnetic domain.
Owner:KOREA RES INST OF STANDARDS & SCI +2
Kerr microscope
InactiveCN108776315AHigh resolutionReduce mechanical instabilityMagnetic field measurement using magneto-optic devicesDomain wall position/motion measurementMagnetic measurementsPhotodetector
The invention relates to the field of magnetic measurement of a material surface and discloses a Kerr microscope. The Kerr microscope comprises a light source, a first aspheric mirror, a second aspheric mirror, a view field diaphragm, a polarizer, a third aspheric mirror, a semi-transparent mirror, an objective lens, a laser, a sample, a sample table, a substrate, a stepping motor, an inclined table, a thimble, a magnet, a slit diaphragm, a first photodetector, a compensator, an analyzer, a fourth aspheric mirror and a second photodetector, wherein the light source, the first aspheric mirror,the second aspheric mirror, the view field diaphragm, the polarizer, the third aspheric mirror, the semi-transparent mirror and the objective lens sequentially form a lighting path; the objective lens, the semi-transparent mirror, the compensator, the analyzer and the fourth aspheric mirror sequentially form an imaging light path; and the laser, the sample surface, the slit diaphragm and the firstphotodetector form a calibration light path. The phenomenon that a lighting area on the sample is changed by a diaphragm slit is not needed, the Kerr sensitivities in different directions are measured, and through adjusting the turning-on number of LED lamps and the lasting time, an image with good resolution is acquired.
Owner:JINHUA VOCATIONAL TECH COLLEGE
Image acquisition system and image acquisition method
ActiveUS20210192178A1Easy to measureMaterial analysis using wave/particle radiationImage memory managementOptical radiationAtomic physics
In an image acquisition system, a distortion distribution is easily measured in a wide range. A standard image of magnetic domain of a sample serving as a standard is acquired by radiation of light using a standard external magnetic field which serves as a standard, a plurality of magnetic domain images are acquired in a state where an external magnetic field is applied while being changed, a plurality of subtraction images obtained by subtracting the standard image of magnetic domain from each of the plurality of magnetic domain images are acquired, a magnetization reversal area in which a magnetic domain is reversed is extracted from each of the plurality of subtraction images, and a composite image having a plurality of magnetization reversal areas is acquired by compositing the plurality of subtraction images each having the magnetization reversal area.
Owner:HITACHI LTD
Resettable closed-loop multi-turn magnetic sensor
Aspects of this disclosure relate to a resettable closed-loop multi-turn magnetic sensor. In one aspect, the sensor includes a nanowire forming a plurality of loops, a plurality of domain orientation sensors configured to detect locations of a pair of domain walls within the nanowire, and an initialization circuit configured to inject the pair of domain walls into the nanowire. The nanowire forms a closed-loop via a bridge crossing connecting two of the loops.
Owner:ANALOG DEVICES INT UNLTD
Image acquisition system and image acquisition method
ActiveCN113030238ASimple and large-scale measurementMaterial analysis using wave/particle radiationImage memory managementImage synthesisLarge range
The invention relates to an image acquisition system and an image acquisition method. In an image acquisition system, a distortion distribution is easily measured in a wide range. A standard image of magnetic domain of a sample serving as a standard is acquired by radiation of light using a standard external magnetic field which serves as a standard, a plurality of magnetic domain images are acquired in a state where an external magnetic field is applied while being changed, a plurality of subtraction images obtained by subtracting the standard image of magnetic domain from each of the plurality of magnetic domain images are acquired, a magnetization reversal area in which a magnetic domain is reversed is extracted from each of the plurality of subtraction images, and a composite image having a plurality of magnetization reversal areas is acquired by compositing the plurality of subtraction images each having the magnetization reversal area.
Owner:HITACHI LTD
Resettable closed-loop multi-turn magnetic sensor
Owner:ANALOG DEVICES INT UNLTD
Magnetoresistance effect element
PendingUS20210318394A1Reduce concentrationReduces RAMagnetic-field-controlled resistorsGalvano-magnetic material selectionFerromagnetismMaterials science
A magnetoresistance effect element includes a first ferromagnetic layer, a second ferromagnetic layer, a nonmagnetic layer that is disposed between the first ferromagnetic layer and the second ferromagnetic layer, and an insertion layer that is disposed at least one of a position between the first ferromagnetic layer and the nonmagnetic layer and a position between the second ferromagnetic layer and the nonmagnetic layer, in which the nonmagnetic layer is composed of an oxide containing Mg and Ga, and the insertion layer is a ferromagnetic component containing Ga.
Owner:TDK CORPARATION
Method of and apparatus for measuring magnitude of magnetization of perpendicular thin film
ActiveUS20200191884A1Magnetisation measurementsMagnetic field offset compensationCondensed matter physicsMaterials science
Provided is a method of measuring a magnitude of magnetization of a perpendicular magnetic thin film, including: forming a stripe pattern in which a first magnetic domain that extends in a y direction and is magnetized in a z direction and a second magnetic domain that extends in the y direction and is magnetized in a direction opposite to the z direction are arranged alternately in an x direction, in a perpendicular magnetic thin film that extends in an xy plane; changing widths in the x direction, of the first and second magnetic domains by applying a magnetic field having a predetermined magnitude, in the z direction, to the perpendicular magnetic thin film; and calculating an absolute value of the magnetization of the perpendicular magnetic thin film on the basis of a ratio between the widths in the x direction, of the first magnetic domain and the second magnetic domain.
Owner:KOREA RES INST OF STANDARDS & SCI +2
Magnetoelectronic components and measurement method
ActiveUS9634236B2Simplified determinationOutput information moreGalvano-magnetic devicesSolid-state devicesCENBOLPower flow
Magnetoelectronic components comprise at least one oblong working structure made of a ferromagnetic material, along which magnetic domain walls can migrate, means for applying an electric current to this working structure, and at least one magnetic field sensor for the magnetic field generated by the working structure. The working structure is designed so that it is able to form domain walls, the transverse magnetization direction of which in the center has no preferred direction in the plane perpendicular to the migration direction thereof along the working structure, and / or can form massless domain walls. It was found that the kinetic energy of such moving domain walls vanishes. These walls are thus not subject to the Walker limit nor to intrinsic pinning. As a result, the components can read, store or process and finally output information more quickly. The invention also relates to a method for measuring the non-adiabatic spin transfer parameter β of a ferromagnetic material. This method was developed as part of a more in-depth examination of the phenomena that were found.
Owner:FORSCHUNGSZENTRUM JULICH GMBH
Magnetic Domain Image Processing Apparatus and Magnetic Domain Image Processing Method
To provide a magnetic domain image processing apparatus and a magnetic domain image processing method by which strain of an electromagnetic steel sheet can be evaluated in more detail. The invention is a magnetic domain image processing apparatus that processes a magnetic domain image, and the magnetic domain image processing apparatus includes: an image acquisition unit configured to acquire a reference magnetic domain image and a positive magnetic domain image or acquire the reference magnetic domain image and a negative magnetic domain image, the reference magnetic domain image being a magnetic domain image that is obtained when a stimulus of a reference intensity that is an intensity serving as a reference is applied to a sample, the positive magnetic domain image being a magnetic domain image that is obtained when the stimulus of an intensity higher than the reference intensity is applied to the sample, and the negative magnetic domain image being a magnetic domain image that is obtained when the stimulus of an intensity lower than the reference intensity is applied to the sample; and an image generation unit configured to generate, based on the reference magnetic domain image and the positive magnetic domain image, or based on the reference magnetic domain image and the negative magnetic domain image, a stress distribution image indicating a distribution of a stress region that is a region where stress is generated.
Owner:HITACHI LTD
Magnetic susceptibility inversion method and system
PendingCN113591021ASave memory spaceImprove computing efficiencySusceptibility measurementsElectric/magnetic detectionMagnetic susceptibilityInverse discrete fourier transform
The invention relates to a magnetic susceptibility inversion method and system. The method comprises the following steps: S1, obtaining a spatial domain residual error based on an observed magnetic field intensity and a theoretical magnetic field intensity; S2, representing the spatial domain residual error through two-dimensional inverse discrete Fourier transform based on the wavenumber domain residual error; S3, obtaining wave number domain model disturbance based on the spatial domain residual error, and further obtaining spatial domain model disturbance based on Fourier inversion; and S4, obtaining a magnetic susceptibility inversion model based on the spatial domain model disturbance. The required memory space is reduced, the calculation efficiency is improved, and the inversion efficiency is further improved.
Owner:青海省第三地质勘查院
Spin element and magnetic memory
ActiveUS11280854B2Operational stability can be improvedGuaranteed uptimeMagnetic-field-controlled resistorsSolid-state devicesElectrical resistance and conductanceMagnetic memory
Owner:TDK CORPARATION
Hall sensor-magnet geometry for large stroke linear position sensing
PendingCN114270145AElectric/magnetic position measurementsMagnetic field measurement using galvano-magnetic devicesMagnetic polesMagnetic flux
Position sensing units comprising: a magnetic assembly (MA) having a width W measured in a first direction and a height H measured in a second direction, and comprising at least three magnets having respective magnetic polarizations defining at least one left MA domain, one middle MA domain and one right MA domain in the first direction, wherein the magnetic polarizations of each MA domain are different; and a magnetic flux measurement device (MFMD) for measuring a magnetic flux B, in which the MA moves relative to the MFMD in the first direction within a stroke L satisfying 1 mm < = L < = 100 mm, the stroke L starting at a first point x0, ending at an end point xmax, and a second point x0, ending at an end point xmax, and wherein a minimum value Dmin of an orthogonal distance D measured along the second direction between a specific MA domain and the MFMD satisfies L / Dmingt; 10.
Owner:COREPHOTONICS
Portable stress detection device
InactiveCN110726961AStress detection implementationForce measurement by measuring magnetic property varationDomain wall position/motion measurementSignal conditioning circuitsHemt circuits
The invention provides a portable stress detection device, and belongs to the field of stress detection technology. The portable stress detection device is mainly composed of an excitation coil, a magnet yoke, a receiving coil, a power amplifier circuit, a signal generating circuit, a DSP module signal conditioning circuit and a collection circuit, and is characterized in that: the excitation coilis connected with the magnet yoke, the magnet yoke is connected with the receiving coil, the excitation coil is connected with the power amplifier circuit, the signal generating circuit is connectedwith the DSP module, the signal conditioning circuit is connected with the receiving coil, and the collection circuit is arranged at an input end of the DSP module. The portable stress detection device provided by the invention utilizes the relationship between the Barkhausen noise and the stress of a ferromagnetic material and realizes the stress detection of the ferromagnetic material, and utilizes DSP digital processing, thereby being convenient, fast, accurate and effective.
Owner:NORTHWEST A & F UNIV
Magnetoresistance effect element including a Heusler alloy ferromagnetic layer in contact with an intermediate layer
ActiveUS11450342B2Magnetic-field-controlled resistorsGalvano-magnetic material selectionProtection layerMaterials science
A magnetoresistance effect element includes a underlayer, a protective layer, a laminated body located between the underlayer and the protective layer and including a first ferromagnetic layer, a non-magnetic layer, and a second ferromagnetic layer in order from a side closest to the underlayer, and an intermediate layer located between the underlayer and the first ferromagnetic layer, or between the second ferromagnetic layer and the protective layer, wherein, one ferromagnetic layer selected from the first ferromagnetic layer and the second ferromagnetic layer and in contact with the intermediate layer is a Heusler alloy having a Co basis, and a main component of the intermediate layer is an element other than Co among elements constituting the Heusler alloy having the Co basis.
Owner:TDK CORPARATION
System and method for simultaneous observation of grains and magnetic domains of grain-oriented silicon steel
ActiveCN108982336BIncreased sensitivityEnhanced magnetic fieldIndividual particle analysisMeasurements of magnetic particlesRegulated power supplyDc voltage
The invention discloses a system and method for simultaneously observing oriented silicon steel crystalline grains and magnetic domains. A magnet yoke is formed by integrally molding a horizontal magnet yoke part, a left side vertical magnet yoke part and a right side vertical magnet yoke part, the horizontal magnet yoke part is wound with a magnet yoke body conductive wire, a DC voltage stabilizing power supply is used for powering the magnet yoke body conductive wire, an area formed by inner sides of the left side vertical magnet yoke part and right side vertical magnet yoke part as well asthe top of the horizontal magnet yoke part is a sample storage area, an oriented silicon steel sample can be arranged in the sample storage area, a magnetic fluid disc is arranged on the upper part ofthe oriented silicon steel sample, a power output end of an external power supply is connected with the input end of the voltage stabilizer, the output end of the voltage stabilizer is connected withan annular conductive wire of the magnetic fluid disc, the magnetic fluid disc provides a magnetic field along a normal of the silicon steel sample, and the magnet yoke provides a magnetic field along a rolling direction of the silicon steel sample. By adopting the system and method for simultaneously observing the oriented silicon steel crystalline grains and magnetic domains, the simultaneous observation of the oriented silicon steel crystalline grains and magnetic domains can be realized by virtue of a powder-pattern method.
Owner:武汉钢铁有限公司
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