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Image acquisition system and image acquisition method

An image and image synthesis technology, applied in image memory management, size/direction of magnetic field, acquisition/recognition of microscopic objects, etc., can solve problems such as limiting the shape of the sample, unable to understand the frequency of strain, unable to grasp the state of strain distribution, etc.

Active Publication Date: 2021-06-25
HITACHI LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, it is difficult to analyze the cause of strain, and the frequency of strain and the cause of strain cannot be clarified.
[0012] In addition, in order to conduct particle size analysis from BSE images, it is necessary to place the sample in a vacuum, which limits the shape of the sample
[0013] According to the method disclosed in Patent Document 1, the magnetic permeability can be estimated based on known materials, but the state of strain distribution cannot be grasped

Method used

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  • Image acquisition system and image acquisition method
  • Image acquisition system and image acquisition method

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0057] refer to figure 1 The configuration of the image acquisition system of the first embodiment will be described.

[0058] The image acquisition system includes a sample stage mechanism system, an optical system and an image processing system.

[0059] The sample stage mechanism system includes: a sample holder (holder) 1 including a sample stage that fixes a magnetic sample 3 and can move in the XYZ axes; and an electromagnetic coil 2 that can apply an external magnetic field. The optical system has a detector 8 . The image processing system has a control device 11 and an image display terminal (GUI) 12 . The control device 11 has a signal processing unit 9 and a storage unit (database) 10 .

[0060] Laser light 5 is incident on the plane of sample 3 as incident light 6 , and incident light 7 reflected on the plane of sample 3 is detected by detector 8 . Here, 4 denotes the sample normal direction. The detection signal detected by the detector 8 is sent to the signal...

Embodiment 2

[0092] refer to Figure 8 The image acquisition method of the second embodiment will be described.

[0093] and figure 2 The difference between the image acquisition method of the illustrated embodiment 1 is that the figure 2 Replace the S102 with S802 at this point. That is, in figure 2 In S102, the magnetic domain image used as a reference is obtained under no magnetic field without applying an external magnetic field. In contrast, in Figure 8 In S802, an external magnetic field is applied to obtain a reference magnetic domain image. Other steps (S101, S103, S104, S105, S106, S107) and figure 2 The image acquisition method in the first embodiment shown is the same, and therefore its description is omitted.

[0094] In the image acquisition method of embodiment 2, as Figure 8 As shown, in the acquisition of a standard magnetic domain image, a magnetic domain image is acquired in a certain desired magnetic field application state. For example, it is also effectiv...

Embodiment 3

[0096] refer to Figure 9 The image acquisition method of the third embodiment will be described.

[0097] In Example 3, until halfway through with Figure 8 The grain boundary image was obtained in the same process as in Example 2 shown. That is, an image of a magnetic domain is acquired, and an image subtracted from an image applied with a predetermined external magnetic field is acquired to acquire an image of a grain boundary region.

[0098] First, the sample 3 is fixed on the sample holder 1, and the surface shape of the sample 3 mounted on the sample holder 1 is observed to obtain a shape image (S901). In addition, no magnetic field is applied from the outside at this point of time. That is, an optical microscopic image is obtained without a magnetic field.

[0099] Next, in the same field of view, a magnetic domain image is acquired with a reference external magnetic field ( S902 ).

[0100] Next, a magnetic domain image is obtained in a state where an external ma...

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Abstract

The invention relates to an image acquisition system and an image acquisition method. In an image acquisition system, a distortion distribution is easily measured in a wide range. A standard image of magnetic domain of a sample serving as a standard is acquired by radiation of light using a standard external magnetic field which serves as a standard, a plurality of magnetic domain images are acquired in a state where an external magnetic field is applied while being changed, a plurality of subtraction images obtained by subtracting the standard image of magnetic domain from each of the plurality of magnetic domain images are acquired, a magnetization reversal area in which a magnetic domain is reversed is extracted from each of the plurality of subtraction images, and a composite image having a plurality of magnetization reversal areas is acquired by compositing the plurality of subtraction images each having the magnetization reversal area.

Description

technical field [0001] The present invention relates to an image acquisition system and an image acquisition method. Background technique [0002] In recent years, there has been an increasing demand for energy saving in order to reduce environmental burdens. Along with this trend, there is an urgent need to improve the performance, controllability, efficiency, and power saving of electronic control components such as motors, solenoids, and transformers. These components mainly include wires and iron cores to convert electrical energy and magnetic energy. Here, being able to efficiently convert energy is most important in energy-saving measures. [0003] The iron core is mainly made of soft magnetic materials, generally electromagnetic steel plates. In electromagnetic steel sheets and soft magnetic materials, when stress or strain occurs, the strength and magnetic properties of the material change. Usually, stress and strain cause material embrittlement, etc., and cause ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/72G01N23/2251G01R33/032G01R33/12G06T1/60
CPCG01N27/72G01R33/1292G01R33/0325G01N23/2251G06T1/60G06V20/693G06V20/698G01R33/09
Inventor 荒木亮子孝桥照生谢骏
Owner HITACHI LTD
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