The invention relates to the field of magnetic measurement of a material surface and discloses a Kerr microscope. The Kerr microscope comprises a light source, a first aspheric mirror, a second aspheric mirror, a view field diaphragm, a polarizer, a third aspheric mirror, a semi-transparent mirror, an objective lens, a laser, a sample, a sample table, a substrate, a stepping motor, an inclined table, a thimble, a magnet, a slit diaphragm, a first photodetector, a compensator, an analyzer, a fourth aspheric mirror and a second photodetector, wherein the light source, the first aspheric mirror,the second aspheric mirror, the view field diaphragm, the polarizer, the third aspheric mirror, the semi-transparent mirror and the objective lens sequentially form a lighting path; the objective lens, the semi-transparent mirror, the compensator, the analyzer and the fourth aspheric mirror sequentially form an imaging light path; and the laser, the sample surface, the slit diaphragm and the firstphotodetector form a calibration light path. The phenomenon that a lighting area on the sample is changed by a diaphragm slit is not needed, the Kerr sensitivities in different directions are measured, and through adjusting the turning-on number of LED lamps and the lasting time, an image with good resolution is acquired.