Magnetization measurement method in complex magnetic domain

Abstract

The invention relates to a magnetization measurement method in the complex magnetic domain, and relates to the field of material surface magnetization measurement. The magnetization measurement methodincludes a vertical Kerr sensitivity measurement method and a pure polar Kerr sensitivity measurement method. A measuring device mainly comprises a light source, a polarizer, a first dichroic mirror,a first aspheric mirror, a visual field diaphragm, a second aspheric mirror, a semi-transparent reflector, an object lens, a sample, a sample bench, a magnet, a compensator, a polarization analyzer,a second dichroic mirror, a third aspheric mirror, a first photoelectric detector, a fourth aspheric mirror and a second photoelectric detector. A bicolor LED lamp array serves as the light source, anillumination area on the sample can be changed needless of a diagram slit, two imaging optical paths can be used, a magnetic-domain image with different magnetization vector components can be obtained without change of the device structure, a magnetization vector image can be obtained directly in real time, measurement time is shorter, the measurement method of the invention is especially suitable for research complex magnetization conversion in a magnetic film structure, complex calibration is not needed, and the operation flow is simple.

Description

technical field [0001] The invention relates to the field of magnetic measurement on the surface of materials, in particular to a method for measuring magnetization in a complex magnetic domain using a special light source structure. Background technique [0002] The magneto-optical Kerr effect measurement device is an important means in the study of material surface magnetism. Its working principle is based on the magneto-optic Kerr effect caused by the interaction between light and magnetized media. Magnetic detection, and non-contact measurement can be realized, and it has important applications in the research of magnetic order, magnetic anisotropy, interlayer coupling and phase transition behavior of magnetic ultrathin films. Kerr microscope is a commonly used device. Its working principle is: after plane polarized light interacts with the surface of a non-transparent magnetic medium, the polarization plane of the reflected light rotates clockwise or counterclockwise, a...

AI Technical Summary

Problems solved by technology

Defect 1 of the prior art: the prior art can only obtain statistical magnetization patterns, that is, the same magnetization distribution must be obtained under different imaging conditions, and only a single vector diagram of a single stable magnetic domain structure can be obtained by this. In addition, the current The vector magnetic domain imaging method in the prior art requires a long measurement time; defect 2 of the prior art: a single-wavelength light source is used in the prior art, and a complicated calibration process is required before the test, and the magnetization in the complex magnetic domain Measurements can solve the problem

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