An on-orbit particle detection and single event effect monitoring system
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANDONG INST OF AEROSPACE ELECTRONICS TECH
- Publication Date
- 2022-06-21
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of space radiation environment detection, in particular to an on-orbit particle detection and single particle effect monitoring system. Background technique
[0002] The space radiation environment is the main environmental factor that causes the performance degradation or even failure of spacecraft materials and components. Among them, high-energy charged particles generate a large number of charged particles in the sensitive area of ββthe device, which induces the single-event effect, which causes the phenomenon of single-event overturning, single-event transient, single-event locking and even single-event burnout, threatening the spacecraft on-orbit. Safe and reliable operation.
[0003] The study of the space environment is the foundation of the study of radiation effects. At present, the basic principle of space charged particle detection is indirect detection based on the ionization or excitation of ...