System and method for testing defect laser-damaged threshold of optical thin film

A laser damage threshold and optical thin film technology, which is applied in the field of optical detection to achieve the effects of improving the laser damage threshold test accuracy, improving test accuracy and high applicability

Inactive Publication Date: 2018-12-11
中国工程物理研究院上海激光等离子体研究所
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Problems solved by technology

[0005] Aiming at the problems existing in the prior art, the present invention provides a testing system and testing method for the laser damage threshold of optical film defects. Evenly distributed, and the peak energy density is used as the problem caused by the defect damage density, thereby improving the test accuracy

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  • System and method for testing defect laser-damaged threshold of optical thin film
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  • System and method for testing defect laser-damaged threshold of optical thin film

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Embodiment Construction

[0037]The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0038] In describing the present invention, it should be understood that the terms "longitudinal", "transverse", "upper", "lower", "front", "rear", "left", "right", "vertical", The orientation or positional relationship indicated by "horizontal", "top", "bottom", "inner", "outer", etc. are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description...

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Abstract

The invention discloses a system for testing a defect laser-damaged threshold of an optical thin film, and the system comprises a laser, an attenuator, a beam splitter, an energy meter, a beam qualityanalyzer, a focusing lens, a CCD camera, a metal film, an optical thin film, a moving platform, a scanning electron microscope and a computer, wherein the laser, the attenuator, the beam splitter, the energy meter, the beam quality analyzer, the focusing lens, the CCD camera, the metal film, the optical thin film, the moving platform, the scanning electron microscope and the computer are sequentially placed according to an optical path. A laser beam emitted by the laser passes through the attenuator to reach the beam splitter. The laser beam in the transmission direction of the beam splitterpasses through the focusing lens to reach the metal film, and the CCD camera records the spot position of the laser irradiation on the surface of the metal film and the coordinates of the laser damagepoint when laser irradiation is on the surface of the optical thin film. The scanning electron microscope records the longitudinal depth position of the laser damage point of the optical thin film, and completes the combination analysis of the subdivision of the lateral energy density of the defect damage point and the normalization processing of a longitudinal electric field. The system can solve a problem caused by a condition that the peak energy density is taken as the defect damage density, thereby improving the testing precision.

Description

technical field [0001] The invention belongs to the field of optical detection, and in particular relates to a test system and a test method for the laser damage threshold of optical film defects. Background technique [0002] Optical thin films are widely used in high-power laser systems, but the laser damage of optical thin films has always been a bottleneck limiting their development. An accurate laser damage threshold not only provides a safe range of use for optical films, but also a prerequisite for research on how to improve their resistance to laser damage. [0003] Under long-pulse laser irradiation, the laser damage of optical films is mainly caused by the defects in the optical films, and the laser damage threshold caused by defects is much smaller than the laser damage threshold corresponding to intrinsic damage. However, the international standard laser damage threshold test method regards the uneven distribution of defect damage as equivalent to the Gaussian d...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/00
Inventor 单翀赵元安高妍琦赵晓晖崔勇饶大幸刘佳妮胡国行马伟新
Owner 中国工程物理研究院上海激光等离子体研究所
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