The invention discloses a system for testing a defect laser-damaged threshold of an optical thin film, and the system comprises a laser, an attenuator, a beam splitter, an energy meter, a beam qualityanalyzer, a focusing lens, a CCD camera, a metal film, an optical thin film, a moving platform, a scanning electron microscope and a computer, wherein the laser, the attenuator, the beam splitter, the energy meter, the beam quality analyzer, the focusing lens, the CCD camera, the metal film, the optical thin film, the moving platform, the scanning electron microscope and the computer are sequentially placed according to an optical path. A laser beam emitted by the laser passes through the attenuator to reach the beam splitter. The laser beam in the transmission direction of the beam splitterpasses through the focusing lens to reach the metal film, and the CCD camera records the spot position of the laser irradiation on the surface of the metal film and the coordinates of the laser damagepoint when laser irradiation is on the surface of the optical thin film. The scanning electron microscope records the longitudinal depth position of the laser damage point of the optical thin film, and completes the combination analysis of the subdivision of the lateral energy density of the defect damage point and the normalization processing of a longitudinal electric field. The system can solve a problem caused by a condition that the peak energy density is taken as the defect damage density, thereby improving the testing precision.