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220 results about "Laser energy density" patented technology

Laser energy density is considered a key factor that affects the properties of as-built parts fabricated by SLM processing. The widely used volume based energy density E (J/mm3) is defined in equation (1), where P is laser power (W), v is scan speed (mm/s), h is hatch spacing (mm) and. t is layer thickness (mm) [1].

Quick high-flexibility manufacturing method for ceramic circuit board

A quick high-flexibility manufacturing method for a ceramic circuit board comprises the following steps: irradiating laser on the surface of a ceramic matrix, and controlling the energy density of the laser to reach above the fracture threshold of the chemical bond of the compound containing active ions, so that chemical reaction occurs on the surface of the ceramic matrix, an active substance is separated out to serve as a chemical plating catalytic source, and the active substrate generated by the reaction and the matrix form chemical metallurgical bonding, wherein different laser sources are selected aiming at different ceramic materials according to the chemical bond energy of the ceramic material components, and the laser energy is controlled to reach the ceramic modified threshold by controlling the average power of laser output, pulse repetition frequency, scanning speed, defocusing amount, space between scanning line and scanning times; and the ceramic matrix modified by the laser is placed into a chemical plating solution to perform plating to form a metal coating. The surface of the ceramic is modified by the laser, so that a metal conductive layer and the matrix form chemical metallurgical bonding, the bonding force of the circuit board is greatly increased, and the heat-conducting property and the electric property are improved.
Owner:SHENZHEN SUNSHINE LASER & ELECTRONICS TECH CO LTD

Monazite 10-micron small-beam-spot LA-Q-ICP-MS U-Th-Pb age determination method

ActiveCN106124606AIncreased Elemental Response StrengthGuarantee optimal detection statusMaterial analysis by electric/magnetic meansRelative standard deviationMass analyzer
The invention discloses a monazite 10-micron small-beam-spot LA-Q-ICP-MS U-Th-Pb age determination method. The method includes the steps that a standard solution sample with the concentration of 1 ppb is directly led into a four-level-rod inductively coupled plasma mass spectrometer, the instrument parameters are optimized, the response strength of <205>T1 is larger than 200,000 cps/ppb, the relative standard deviation is 1% to 2%, the double charges are smaller than 1.5%, and the yield of oxidation is smaller than 1%; an artificial glass NTSI 610 solid standard sample is led into the four-level-rod inductively coupled plasma mass spectrometer in a laser ablation mode, carrier gas of a laser and carrier gas of the four-level-rod inductively coupled plasma mass spectrometer are matched, and counting of <238>U reaches the maximum; a monazite standard sample 44069 is led into the four-level-rod inductively coupled plasma mass spectrometer in a laser ablation mode, the density of laser energy is 3 J/cm<2>, the impulse frequency is 4 Hz, and the age of monazite U-Th-Pb is determined through a 10-micron small laser beam spot. By means of the method, the space resolution ratio of monazite LA-Q-ICP-MS U-Th-Pb age determination is increased, and the testing requirement of monazite is met.
Owner:XIAN CENT OF GEOLOGICAL SURVEY CGS

Preparation method of high-accuracy ceramic printed circuit board

The invention discloses a preparation method of a high-accuracy ceramic printed circuit board. The preparation method comprises the steps of radiating laser on the surface of a ceramic substrate covered with a palladium ion solid film, controlling the energy density of the laser to reach above a modified threshold of the substrate, allowing a V-shaped microgroove structure to be formed on the surface of the ceramic substrate, allowing a palladium ion in a microgroove to be reduced to an atom state, bonding the palladium ion with an oxygen atom at a high temperature to form palladium oxide with very high chemical stability, forming firm metallurgical bonding with the substrate, allowing the structure on the surface of the substrate in a heat affected zone of the laser not to be changed, and only allowing the palladium ion to be reduced to metal palladium. Metal palladium in the heat affected zone is selectively removed by the chemical cleaning step; palladium oxide in the microgroove structure is left as an active center of catalytic chemical plating reaction; and then a high-accuracy conducting circuit can be obtained by implementing chemical plating. According to the preparation method, the conducting circuit can be quickly prepared on the surface of the ceramic substrate; the preparation method has no special requirement for a material of the substrate; and the obtained conducting circuit is high in accuracy, good in conductivity and high in binding force.
Owner:HUAZHONG UNIV OF SCI & TECH

Method for forming porous film, insulating film for semiconductor element, and method for forming such insulating film

When laser ablation is implemented with respect to a target comprising silicon in an atmosphere containing oxygen, Si constituting the target is ejected from the laser irradiated portion thereof. The ejected Si collides with oxygen, which is the atmosphere gas, and reacts therewith in a gas phase forming clusters composed of SiO2 or SiOx, or silicon (Si) and oxygen, and containing pores with a size of several nanometers. The clusters adhere to the substrate, thereby forming a porous film composed of Si and oxygen and containing pores on the substrate. Furthermore, an insulating film for a semiconductor element is formed to have a multilayer structure in which an aggregate is deposited on the substrate and then a dense film is formed. When the insulating film is formed, the aggregate is produced by implementing laser ablation under a pressure of 1 Kpa, for example. Then, a pressure transition from this 1 KPa to 10 Pa, for example, is caused and a dense film is formed by implementing laser ablation under this pressure of this 10 Pa by adjusting a parameter (for example, laser energy density) other than pressure. The thickness of each layer in the multilayer structure composed of the aggregate and dense film and the thickness ratio of the layers is adjusted by adjusting the number of times the target is irradiated with the laser beam.
Owner:KOMATSU LTD

Laser cleaning method and device for insulator RTV coating

The invention provides a laser cleaning method for an insulator RTV coating. The method comprises the following steps that 1, position parameters, appearance parameters and temperature of the insulator RTV coating are measured; 2, laser parameters are determined; and 3, the insulator RTV coating is removed. The laser is used for treating the surface of the RTV coating, the laser is directly actedon pollutants without mechanical contact, and the pollutants are directly gasified, ablated and photodecomposed, so that the high degree of mechanization is realized, the damage to the substrate can be effectively avoided, the surface form of the substrate can be controlled and changed, and a novel surface cleaning technology with relatively high working efficiency is achieved. It can be seen thatnon-contact cleaning and long-distance cleaning of the laser cleaning method for the insulator RTV coating have the characteristics of environmental protection and energy conservation, and the cleaning efficiency and effect can be obviously improved in the aspect of maintenance and use; and meanwhile, the laser cleaning method can effectively avoid damaging the substrate, accurately adjust the laser energy density, and effectively protect the substrate while improving the cleaning efficiency of the RTV coating.
Owner:CHINA ELECTRIC POWER RES INST +3

Preparation process of amorphous silicon film solar battery based on laser etched and crystallized optical film layer

The invention relates to a preparation process of a novel amorphous silicon film solar battery based on a laser etched and crystallized optical film layer, which belongs to the technical field of inorganic material solar device preparation. An optical film comprises an antireflective film, a transmission increasing film, a reflection increasing film and the like, and the invention achieves the reflection increasing and transmission increasing functions of a modulation optical film layer mainly by controlling the grain size. The method comprises the following steps of: depositing three layers of amorphous silicon (a-Si) films respectively in a P type, an I type and an N type on indium tin oxide (ITO) conductive glass by a plasma-enhanced chemical vapor deposition (PECVD) method, and then irradiating the surface of a sample by using frequency-doubled Nd YAG laser with the wavelength of 532nm to realize the conversion of an N type layer from amorphous silicon to a polycrystalline silicon (poly-Si) optical film layer. The polycrystalline silicon grain size of the crystallized optical film layer is controlled by changing the laser energy density to regulate the photoelectric conversion efficiency. The inorganic material solar energy of the invention can be applied to solar automobile film glass and building film glass curtain walls.
Owner:SHANGHAI UNIV

Penetrating type laser welding method of solar cell bus bars

The invention relates to a penetrating type laser welding method of solar cell bus bars. The method comprises the following steps: outputting a laser beam through a pulse laser device, carrying out beam expansion control on diameter of the laser beam through a beam expander, focusing the laser beam subjected to beam expansion on a welding sample through a laser welding head, and enabling the laserwelding head to horizontally move up and down to adjust the size of a laser focal point and a laser welding spot; applying pre-pressure to a position near an area to be welded through a pre-pressingmechanism to enable two layers of welding strips to be in full contact with each other; receiving thermal radiation reflection laser in the welding process through a temperature feedback system, collecting a welding thermal radiation laser beam and converting the welding thermal radiation laser beam into temperature information, and calibrating the temperature of the welded area; enabling a visualimage system to move up and down to adjust a visual image focal point and identifying position information of the welding sample; focusing pulse laser on the welding strips, forming extremely high laser energy density in an action area, directly gasifying tin on the surface layers and copper on the inner sides of the welding strips, forming cavities in the materials and enabling the materials tobe tightly occluded with each other, and directly carrying out fusion welding of copper layers of the two layers of welding strips. The welding quality is high.
Owner:江阴德龙能源设备有限公司

Optical film defect laser damage threshold test method

The invention discloses an optical film defect laser damage threshold test method. According to the method, after a laser beam passes through an attenuator and arrives at a beam splitter, and the laser beam in the transmission direction of the beam splitter passes through a focusing lens and arrives at a metal film; a CCD camera records a spot position where the laser irradiates on the surface ofthe metal film and a laser damage point coordinate where the laser irradiates on the surface of the optical film; and a scanning electron microscope records the longitudinal depth position of the defect damage point of the optical film in the irradiation of the laser and completes a defect damage point lateral energy density subdivision and longitudinal electric field normalization processing-combined analysis. In an optical film defect laser damage threshold test in the prior art, randomly-distributed defect damage points and laser energy density of Gaussian distribution in a laser spot are considered to be uniformly-distributed damage points and laser energy density equivalently, and influence on the defect damage point caused by the electric field distribution of the optical film is ignored, and as a result, many problems are brought about, while with the optical film defect laser damage threshold test method of the invention adopted, the above problems can be solved, and test accuracy can be improved.
Owner:中国工程物理研究院上海激光等离子体研究所

A double-light source laser annealing device and method

The invention discloses a dual-light source laser annealing device and a method, which pertains to the semiconductor manufacturing equipment and technical scope. The dual-light source laser annealing device comprises a laser light source for annealing, light sources which have the wavelength of sub-micron to micron scale and are used for auxiliary heating, an optical lens system and a wafer carrier. The processing method is that the oblique incidence of the auxiliary heating light beams reaches the surface of a substrate wafer, and the pre-heating is carried out at the substrate surface before the formal laser annealing, so as to improve the adverse effects of the thermal stress on the annealing and the wafer surface appearance. On the other hand, as the processing of pre-heating, a great number of phonons are introduced to a superficial surface layer of the substrate wafer, the existence of the phonons can be conductive to the relaxation of carrier energy and obtain better annealing effect, so the temperature raise of a crystal lattice and the annealing process of the wafer can be completed in a shorter time, and the more shallow ultra-shallow junction can also be obtained. Due to the pre-heating of the crystal lattice, the laser energy density which is needed by the laser annealing is also reduced.
Owner:TSINGHUA UNIV

Preparation method of nanoparticle linear array resistor

The invention provides a preparation method of a nanoparticle linear array resistor. The preparation method comprises the steps: a prepared sample is obtained; the prepared sample is put on a three-dimensional micro displacement platform; femtosecond pulse laser passes through an optical path system to transmit a quartz slide to be focused on the surface of a gold film; a PC controls the three-dimensional micro displacement platform to move in the directions of a Y axis and a Z axis; the gold film is subjected to ablation by the focused laser to form plasma spray in a constraint space; the spayed gold nanoparticles are received by the covered glass, and the gold nanoparticle linear array resistor is obtained on the glass surface; and the morphology features of the gold nanoparticle lineararray resistor are represented. The method is based on a femtosecond laser micro-nano processing platform and is combination with a laser induced backward transfer technology; by controlling femtosecond pulse laser energy density, scanning speed and processing number of branches, the linear array resistor formed by the gold nanoparticles is prepared; and the gold nanoparticle morphology features of different processing parameters are represented by a scanning electron microscope and an atomic force microscope.
Owner:GUANGZHOU UNIVERSITY

Method for evaluating repetitive frequency laser damage resistance of optical thin film

The invention provides a method for evaluating repetitive frequency laser damage resistance of an optical thin film. The method comprises the following steps: irradiating different test points of a thin film sample to be tested with a series of sequence laser pulse with a certain energy density, determining and recording a damage state of each test point, and calculating small damage probability at the energy density; repeatedly changing the energy density of the laser to irradiate different test points of the thin film sample to be tested, determining and recording the damage probability of each test point, and respectively calculating the small damage probability at each energy density; respectively taking the energy density and the small damage probability as a horizontal coordinate and a longitudinal coordinate to draw a change curve of the small damage probability with the laser energy density, and evaluating the repetitive frequency laser damage resistance of the optical thin film at the energy density corresponding to a damage probability peak value of the probability curve. The energy density is higher, the repetitive frequency laser damage resistance of the optical thin film is better. The method helps simplify and practice methods for evaluating the repetitive frequency laser damage resistance of optical films.
Owner:SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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