High Voltage Dichotomous Test Method for Wire Rod Testers
A technology of a wire tester and a test method, which is applied in the direction of testing dielectric strength, instruments, and measuring electricity, can solve the problems affecting the complexity of wire testing, low test efficiency, and long time consumption, so as to improve test efficiency and test accuracy and reliability. , the effect of reducing the number of tests
Active Publication Date: 2020-11-06
CHANGZHOU TONGHUI ELECTRONICS
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Problems solved by technology
If there are too many wire pins, it will inevitably affect the complexity of wire testing.
The high-voltage parameters of the wire often take the longest time. If the number of pins is large, the test efficiency will be lower.
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[0020] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.
[0021] A high-voltage dichotomous testing method for a wire tester, comprising the following steps:
[0022] First scan the pins of the wire, and the pins that are short-circuited together are regarded as one pin, and the pins that are mutually disconnected are numbered in sequence: 1, 2, 3, ... n, assuming n is 2 m The power of the power, if n is not the m power of 2, press Figure 5 list to fetch values.
[0023] Then by the dichotomous test method of the present invention:
[0024] Step 1: Divide n into two: 1~n / 2 connected to the high end of the test; n / 2+1~n connected to the low end of the test;
[0025] Step 2: continue with two points: ...
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The invention relates to a high-voltage binary test method for a wire tester. The method comprises the following steps: scanning pins of the wire by a system, wherein the pins short-circuiting together are regarded as one pin, the pins which are mutually disconnected are sequentially numbered for 1, 2, 3, to n, and n is supposed as the power of the mth power of 2; binary-dividing the n until the binary-division cannot be performed anymore, wherein 1 to n / 2 is connected to a test high end, and n / 2+1 to n is connected to a test low end; listing pin setting lists for each test according to the above binary method for high-voltage test; judging the high-voltage parameter of the wire as unqualified as long as a failure occurred during the test, and judging the high-voltage parameter of the wireas qualified only when the test results of all the steps are all qualified. The high-pressure binary test method for the wire tester can greatly reduce the number of tests of the high-pressure parameter to greatly improve the test efficiency, is accurate and reliable in test, and ensures the quality of the product.
Description
Technical field: [0001] The invention relates to the technical field of electronic testing, in particular to a high-voltage dichotomous testing method for a wire tester. Background technique: [0002] In today's electronic age, the development of wires is getting faster and faster, and there are more and more types. The number of pins of the wire is often a lot, for example, there are 46 pins at both ends of the Typec wire. Then there are too many wire pins, which will inevitably affect the complexity of wire testing. The high-voltage parameters of the wire often take the longest time. If the number of pins is large, the test efficiency will be lower. [0003] If there is a wire with 8 pins, you need to test its high voltage parameters. We judge whether the high-voltage parameters of a wire are qualified, then the requirement: the high-voltage parameters between any two pins of the wire are qualified. Then according to the permutation and combination formula, it can be c...
Claims
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IPC IPC(8): G01R31/12
CPCG01R31/1272
Inventor 赵浩华高志齐刘亚国
Owner CHANGZHOU TONGHUI ELECTRONICS