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Forward current surge experiment circuit of diode

A technology of forward current and experimental circuit, applied in the direction of diode test, single semiconductor device test, etc., can solve the problems of large current setting deviation and low control accuracy, and achieve the effect of eliminating pull-down and avoiding mutual interference

Pending Publication Date: 2019-01-18
CHINA ZHENHUA GRP YONGGUANG ELECTRONICS CO LTD STATE OWNED NO 873 FACTORY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Since the control of the inrush current is an open-loop control, the setting deviation of the current shown is large, and the control accuracy is not high

Method used

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  • Forward current surge experiment circuit of diode
  • Forward current surge experiment circuit of diode

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Embodiment Construction

[0018] The technical solution of the present invention is further described below, but the scope of protection is not limited to the description.

[0019] A diode forward current surge experimental circuit, including a power supply circuit and a control circuit, the control circuit includes two sets of control shunts, and the control shunts are respectively connected to the power supply circuit.

[0020] The power supply circuit includes an energy storage capacitor C, one end of the energy storage capacitor C is connected to the DC power supply V1, the other end of the energy storage capacitor C is respectively connected to the switch S1 and the control circuit, and the other end of the switch S1 is connected to the diode under test.

[0021] The control branches all include a current controller, a current control transistor, a current sensor, a current waveform regulator, and a diode. The anode of the diode is connected to the diode under test, and the cathode of the diode is ...

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PUM

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Abstract

The invention provides a forward current surge experiment circuit of a diode. The forward current surge experiment circuit comprises a power supply circuit and a control circuit, the control circuit comprises two groups of control branch circuits, and the control branch circuits are connected with the power supply circuit. According to the forward current surge experiment circuit, a reverse half-wave voltage and a forward half-wave current can be simultaneously applied to the diode during a sinusoidal half-wave surge experiment, and occurrence of surge of the diode in a usage state is simulated; the sinusoidal half-wave surge frequency is adjustable from 40 Hz to 100 Hz, and the conditions of occurrences of surges of the diode in different operating frequencies can be tested; when 50 Hz isadopted for the sinusoidal half-wave surge, a surge waveform conduction angle thereof is greater than 175 degrees; closed-loop control is adopted so that the surge current control thereof reaches 1%;and the surge energy is stored by employing a capacitor so that the reduction of the voltage of a power grid by the surge experiment is eliminated, and mutual interference of electrical appliances inthe same power grid is avoided.

Description

technical field [0001] The invention relates to a diode forward current surge experimental circuit. Background technique [0002] The purpose of the diode's forward surge current (I_FSM) test is to determine the ability of the device chip and contacts to withstand current surges when the device under test is subjected to high forward current stress conditions. The original test method is to directly use the 50Hz commercial power to generate a low-voltage and high-current sine half wave through a transformer. The circuit is as follows: figure 2 . Since the control of the inrush current is an open-loop control, the setting deviation of the current shown is large, and the control accuracy is not high. The conduction angle of the sine half wave of the surge current is less than 170°. Since the commercial power of 50Hz is used, only half-sine wave pulses with a time constant of less than 10ms can be generated. Do not apply forward current when doing surge test. Contents of ...

Claims

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Application Information

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IPC IPC(8): G01R31/26
CPCG01R31/2632
Inventor 廖从勇曾令军沈平东夏景仁
Owner CHINA ZHENHUA GRP YONGGUANG ELECTRONICS CO LTD STATE OWNED NO 873 FACTORY