Method for measuring and calculating the life of an electronic product
A technology of electronic products and longevity, applied in the field of electronics, can solve problems such as increased time and workload, imperfect simulation of the service environment of electronic products, increased hardware requirements, etc., and achieves simple process, high practical value, promotion value, and hardware requirements low effect
Pending Publication Date: 2019-02-26
HUNAN CSR TIMES ELECTRIC VEHICLE
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Problems solved by technology
However, as the types of environmental stresses that need to be simulated increase, the hardware requirements for the test will also increase, and the time and workload required for the test will also increase.
Therefore, in actual operation, the test environment cannot perfectly simulate the actual service environment of electronic products, which makes the life of electronic products obtained inaccurate
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[0051] The implementation of the present invention will be described in detail below in conjunction with the accompanying drawings and examples, so that implementers of the present invention can fully understand how the present invention uses technical means to solve technical problems, and achieve the realization process of technical effects and according to the above-mentioned realization process The present invention is implemented concretely. It should be noted that, as long as there is no conflict, each embodiment and each feature in each embodiment of the present invention can be combined with each other, and the formed technical solutions are all within the protection scope of the present invention.
[0052] In the prior art, the service life of the electronic product is usually calculated by simulating the actual service environment of the electronic product in a test environment. However, electronic products are usually affected by various environmental stresses such ...
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The invention discloses a method for measuring and calculating the life of an electronic product. The method comprises the following steps: single stress life test is respectively carried out according to different stress types which affect the life of the electronic product to be measured, and the average life measurement value of single stress corresponding to each stress type is obtained. Weighted synthesis is carried out on all single stress average life estimated values to calculate the life of the electronic product to be tested. Compared with the prior art, the method of the invention has the advantages of simple process, low hardware requirement, and obtaining the life measurement value with higher accuracy, and has higher practical value and popularization value.
Description
technical field [0001] The invention relates to the field of electronic technology, in particular to a method for measuring and calculating the life of an electronic product. Background technique [0002] With the continuous development of electronic technology, more and more electronic products are used in the daily production and life of human beings. [0003] Generally, electronic products will age and damage with continuous use. With the continuous expansion of the application range of electronic products, in a system, the damage of a single electronic product will often cause a series of chain reactions. Therefore, in order to maintain the stability of the entire system, it is necessary to monitor the damage of electronic products in time and replace them. [0004] However, real-time monitoring consumes a lot of resources, and real-time monitoring can only find problems and replace electronic products when they are damaged. At this time, the chain reaction caused by e...
Claims
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Login to View More IPC IPC(8): G06F17/50
CPCG06F2119/04G06F30/20Y02P90/30
Inventor 袁莹莹张旭辉彭再武王征宇唐广笛王海斌杜绍华夏一帆王宇沈泽华
Owner HUNAN CSR TIMES ELECTRIC VEHICLE