Leakage current detecting device and method

Abstract

The invention provides a leakage current detecting device and method used to detect the leakage current of a detected circuit in an idle state. The leakage current detecting device comprises a capacitor, a pre-charging circuit, a discharging current generator and a detection result generator. The pre-charging circuit provides a pre-charging current in a first time interval to pre-charge the capacitor. In the idle state of the detected circuit, the discharging current generator generates a discharging current in the second time interval according to the leakage current, so that the capacitor implements discharging according to the discharging current. In the second time interval, the detection result generator generates a leakage detection result by comparing a voltage value in the detection end point with a voltage value of a present reference voltage.

Description

technical field [0001] The invention relates to a leakage current detection device and a detection method thereof, in particular to a leakage current detection device capable of detecting and reducing the leakage current of a circuit under test in an idle state and a detection method thereof. Background technique [0002] With the advancement of technology, components of integrated circuits (ICs) have been miniaturized to nanometer size, and related technical personnel are moving towards the design goal of reducing the threshold voltage (Threshold Voltage) of transistors and their operating voltages. However, in order to meet the above design requirements, the leakage current (leakage current) that may be generated by the electronic circuit is further increased. In addition, when the electronic device is in the operating state, it is easily affected by the heat generated inside the chip or the external ambient temperature, which may cause unpredictable leakage currents due t...

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Problems solved by technology

However, in order to meet the above design requirements, the leakage current (leakage current) that may be generated by the electronic circuit is increased.

In addition, when the electronic device is in the operating state, it is easily affected by the heat generated inside the chip or the external ambient temperature, which may cause unpredictable leakage currents due to temperature changes during the operation of the electronic device. size

This situation not only seriously affects the working efficiency of the electronic circuit itself, but also reduces the yield rate of the chip production and the performance of the electronic device.

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