A dual-circuit integrated circuit trimming device

Abstract

The invention discloses a two-circuit integrated circuit trimming device, which comprises a main circuit and an auxiliary circuit with different resolutions, the main circuit and the auxiliary circuit respectively comprise and are connected in sequence, and a switch control circuit is used for receiving a switch signal, so as to generate a signal according to the switch signal. and output control instructions; the integrated control chip generates a strobe signal according to the control instructions; the burn-in selection circuit generates a square wave signal according to the strobe signal and outputs it from the test terminal; the square wave signal sequentially includes the pre-start sequence, activation sequence, fuse selection sequence and Burn-in timing; when the square wave signal is in the fuse selection timing, the burn-in selection circuit outputs the selection code to connect the corresponding fuse in the semiconductor chip; when the square wave signal is in the burn-in timing, the burn-in selection circuit continues to output a high level of The square wave signal is sent to the corresponding fuse to blow the fuse. The beneficial effect is that the electrical parameters in the compensation circuit can be simultaneously trimmed and adjusted by two circuits, which can be trimmed manually and matched with the testing machine at the same time.

Description

technical field [0001] The present invention relates to the technical field of integrated circuits, in particular to a dual-circuit integrated circuit trimming device. Background technique [0002] In the process of integrated circuit manufacturing, the circuit will be perfectly simulated when the circuit is designed, and the matching of the devices will also be perfectly combined according to the process model of the actual wafer manufacturer. desired matching effect. [0003] At present, taking a common integrated circuit as an example, a single integrated circuit will include tens of thousands, hundreds of thousands or even millions and tens of millions of NMOS tubes or PMOS tubes; so many MOS tubes of 1um*1um are put together , and its output magnitude can reach the magnitude of ten to dozens of MVs. After many experiments and verification, the threshold difference between MOS tubes obeys a normal distribution. [0004] Therefore, in the prior art, there is no way to ...

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Problems solved by technology

[0004] Therefore, in the existing technology, there is no way to achieve high accuracy of a certain parameter by simply increasing the area of ​​each integrated circuit, and after manufacturing, the integrated chip parameters will deviate from the predetermined range

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