System Interface Temporal Knowledge Analysis System Based on Fine-grained Feature Semantic Network
A semantic network and analysis system technology, applied in the field of system interface timing knowledge analysis system, can solve problems such as poor inheritance of engineering technology experience, lack of system knowledge guidance, etc., and achieve the effect of improving security, improving practicability, and improving test efficiency
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Embodiment 1
[0066] This embodiment specifically describes an interface timing knowledge analysis method for data validity.
[0067] Such as figure 2 As shown, the method includes:
[0068] Step 1: Build an embedded system test fault set and provide an embedded system test fault set. For the faults encountered in the testing process, collect the problem name, problem description, and problem type of the fault to form an embedded system test fault set.
[0069] Step 2: Search for interface problems in the embedded system test fault set, analyze and extract timing-related faults, and initially form a timing-related interface fault set. Retrieve the problem types in the embedded system test fault set, search for the keywords "data" and "interface", collect the problems related to the data interface, and filter out the problems related to timing to form a timing-related data interface fault set.
[0070] Step 3: Search for timing-related faults in the embedded system test fault set, analyz...
Embodiment 2
[0075] This embodiment specifically describes an interface timing knowledge analysis method for data validity.
[0076] Such as image 3 as shown,
[0077] Step 1: Build an embedded system test fault set and provide an embedded system test fault set. For the faults encountered in the testing process, collect the problem name, problem description, and problem type of the fault to form an embedded system test fault set.
[0078] Step 2: Search for interface problems in the embedded system test fault set, analyze and extract timing-related faults, and initially form a timing-related interface fault set. Retrieve the problem types in the embedded system test fault set, search for the keywords "time" and "interface", collect the problems related to the time interface, and filter out the problems related to timing to form a timing-related time interface fault set.
[0079] Step 3: Search for timing-related faults in the embedded system test fault set, analyze and extract interfac...
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