System Interface Temporal Knowledge Analysis System Based on Fine-grained Feature Semantic Network

A semantic network and analysis system technology, applied in the field of system interface timing knowledge analysis system, can solve problems such as poor inheritance of engineering technology experience, lack of system knowledge guidance, etc., and achieve the effect of improving security, improving practicability, and improving test efficiency

Inactive Publication Date: 2019-03-12
北京京航计算通讯研究所
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is: how to solve the problems of lack of system knowledge guidance and poor inheritance of engineering technology experience in the software testing process in the field of software engineering

Method used

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  • System Interface Temporal Knowledge Analysis System Based on Fine-grained Feature Semantic Network
  • System Interface Temporal Knowledge Analysis System Based on Fine-grained Feature Semantic Network
  • System Interface Temporal Knowledge Analysis System Based on Fine-grained Feature Semantic Network

Examples

Experimental program
Comparison scheme
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Embodiment 1

[0066] This embodiment specifically describes an interface timing knowledge analysis method for data validity.

[0067] Such as figure 2 As shown, the method includes:

[0068] Step 1: Build an embedded system test fault set and provide an embedded system test fault set. For the faults encountered in the testing process, collect the problem name, problem description, and problem type of the fault to form an embedded system test fault set.

[0069] Step 2: Search for interface problems in the embedded system test fault set, analyze and extract timing-related faults, and initially form a timing-related interface fault set. Retrieve the problem types in the embedded system test fault set, search for the keywords "data" and "interface", collect the problems related to the data interface, and filter out the problems related to timing to form a timing-related data interface fault set.

[0070] Step 3: Search for timing-related faults in the embedded system test fault set, analyz...

Embodiment 2

[0075] This embodiment specifically describes an interface timing knowledge analysis method for data validity.

[0076] Such as image 3 as shown,

[0077] Step 1: Build an embedded system test fault set and provide an embedded system test fault set. For the faults encountered in the testing process, collect the problem name, problem description, and problem type of the fault to form an embedded system test fault set.

[0078] Step 2: Search for interface problems in the embedded system test fault set, analyze and extract timing-related faults, and initially form a timing-related interface fault set. Retrieve the problem types in the embedded system test fault set, search for the keywords "time" and "interface", collect the problems related to the time interface, and filter out the problems related to timing to form a timing-related time interface fault set.

[0079] Step 3: Search for timing-related faults in the embedded system test fault set, analyze and extract interfac...

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PUM

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Abstract

The invention belongs to the technical field of software engineering, in particular to a system interface timing knowledge analysis system based on a fine-grained feature semantic network. Searching for the key interface problems in the test fault set of embedded system, analyzing and extracting the time-related faults, initially forming the time-related interface fault set; Searching for the keyfaults related to time sequence in embedded system test fault set, analyzing and extracting the faults related to interface to form the fault set related to time sequence; Two fault sets and forming an interface sequential fault set; According to the fault types in the sequential fault database, the key influencing factors of interface sequencing are extracted by using the semantic network based on fine-grained features, and the embedded system interface sequential knowledge set is formed. The sequential knowledge of embedded system interface can realize the inheritance of test knowledge, andit is scalable, easy to push the test knowledge and improve the test efficiency.

Description

technical field [0001] The invention belongs to the technical field of software engineering, and in particular relates to a system interface timing knowledge analysis system based on a fine-grained feature semantic network. Background technique [0002] In engineering applications, software quality is mostly evaluated through software testing. According to statistics, among the 567 software tested in professional software testing institutions, 31,958 problems were found, including code problems, documentation problems, timing problems, interface problems, etc. There are large differences in user habits and user habits. When searching for related problems, a large amount of information is missed due to the diversity of descriptions. Therefore, it is imperative to summarize test failure problems and form test knowledge. [0003] At present, the summary of test knowledge is manually summarized. The description structure of test knowledge is loose, low in correlation, and lacks...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3672
Inventor 王佳佳李娜张晛杨楠王颖唱明旭张依漪王栋
Owner 北京京航计算通讯研究所
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