Method for holding ultrathin semiconductor wafer in semiconductor integration process
A semiconductor and ultra-thin technology, applied in the fields of semiconductor devices, semiconductor/solid-state device manufacturing, electric solid-state devices, etc., can solve the problems of fragility, deformation and curling of ultra-thin semiconductor wafers, air bridge structure breakage, etc. The effect of bonding integration yield, reducing the risk of splitting
Active Publication Date: 2019-03-19
南京中电芯谷高频器件产业技术研究院有限公司
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Problems solved by technology
As the thickness of the wafer decreases, the ultra-thin semiconductor wafer itself no longer has enough strength to maintain a flat state. Due to stress and its own gravity, the ultra-thin semiconductor wafer is easily deformed and curled. Fragmentation easily during transfer and processing
In addition, on the surface of semiconductor chips, especially microwave and millimeter wave chips, the wiring of many air bridge structures in the distribution, the stress on the wafer and the resulting large-scale deformation are likely to cause the breakage of the air bridge structure
Method used
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[0037] A method for holding an ultra-thin semiconductor wafer in a semiconductor integration process, comprising the following steps:
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Abstract
The invention discloses a method for holding an ultrathin semiconductor wafer in a semiconductor integration process. The method comprises steps of 1) spin-coating the front side of a first temporarycarrier with a first temporary bonding adhesive; 2) oppositely bonding the ultrathin semiconductor wafer to the front side of the first temporary carrier; 3) spin-coating the front side of a second temporary carrier with a second temporary bonding adhesive; 4) oppositely bonding the ultrathin semiconductor wafer to the front side of the second temporary carrier; 5) separating the ultrathin semiconductor wafer from the first temporary carrier; 6) preparing an integrated interconnection structure; 7) performing a bonding integration process; and 8) separating the integrated wafer from the secondcarrier. The method, by means of the matching of the two temporary bonding adhesives having different softening temperatures and two temporary carriers and by using uses temporary bonding and debonding processes, ensures that the ultrathin semiconductor wafer is supported by the temporary carriers in transmission, clamping, interconnection structure manufacture, and a three-dimensional integration process such as bonding, and reduces the facture risk in the integrated process.
Description
technical field [0001] The invention belongs to the technical field of semiconductor technology, and in particular relates to a method for holding ultra-thin semiconductor wafers in semiconductor integration technology. Background technique [0002] The three-dimensional stacking integration technology of semiconductor chips is one of the key ways for electronic components to be further miniaturized, lightweight, multi-functional and intelligent in the post-Moore era. By stacking and integrating various semiconductor devices or wafers in the vertical direction, it can reduce Small system size, light weight, while improving overall performance. Generally speaking, the front and back processes of the wafer to be integrated have been completed or most of them have been completed. In order to improve the electrical performance of the device circuit, improve the heat dissipation efficiency, and reduce the packaging volume, etc., it is necessary to thin the semiconductor wafer to ...
Claims
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Login to View More IPC IPC(8): H01L21/683
CPCH01L21/6835H01L2221/68359H01L2221/68381H01L2221/6835
Inventor 戴家赟吴立枢王飞郭怀新陈堂胜
Owner 南京中电芯谷高频器件产业技术研究院有限公司



