Fault simulation method of logic circuit single-particle double-fault

Abstract

The invention provides a fault simulation method of logic circuit single-particle double-fault. The method comprises the following steps: the first step: executing single-particle double-fault positioning in a target logic circuit so as to search for a target logic gate pair; the second step: determining a type of the searched target logic gate pair; the third step: in allusion to circuit logic ofthe target logic circuit, acquiring normal circuit response in the case that input excitation is applied to the target logic circuit; and the fourth step: in allusion to the target logic circuit, executing double-fault simulation, adding a non-logic gate to the output end of at least one logic gate in the searched target logic gate pair, and acquiring circuit response in the case that the input excitation which is the same as that in the third step is applied to the whole target logic circuit after the non-logic gate is added.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a fault simulation method for single-event double faults in logic circuits. Background technique [0002] A transient fault in a digital integrated circuit (logic circuit) is an instantaneous, recoverable, faulty logic pulse that occurs at random times and locations. There are many environmental factors that cause this transient fault pulse, such as: power supply noise, electromagnetic interference, and radiation of space high-energy particles (alpha particles and neutrons). With the improvement of chip integration, the scale of the circuit continues to increase, and the threshold voltage continues to decrease. The transient failure caused by the impact of high-energy particles on the circuit unit has brought severe challenges to the reliability of the logic circuit. [0003] Generally speaking, the high-energy particle effect that causes a transient fault is called a s...

AI Technical Summary

Problems solved by technology

The deficiency of the existing technology is that the processing of these links is not perfect, or the analysis of the fault model is not accurate enough.

In addition, the low efficiency of fault simulation is also a prominent problem

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