Fault simulation method of logic circuit single-particle double-fault

A logic circuit and fault simulation technology, applied in electronic circuit testing, measuring electricity, measuring electrical variables, etc., can solve the problems of inaccurate fault model analysis, incomplete processing, and low fault simulation efficiency.

Active Publication Date: 2019-03-22
CHANGSHA UNIVERSITY OF SCIENCE AND TECHNOLOGY
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

The deficiency of the existing technology is that the processing of these links is not perfect, or the analysis of the fault model is not accurate enough.
In addition, the low efficiency of fault simulation is also a prominent problem

Method used

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  • Fault simulation method of logic circuit single-particle double-fault
  • Fault simulation method of logic circuit single-particle double-fault
  • Fault simulation method of logic circuit single-particle double-fault

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Embodiment Construction

[0028] In order to make the content of the present invention clearer and easier to understand, the content of the present invention will be described in detail below in conjunction with specific embodiments and accompanying drawings.

[0029] After the manufacturing process of integrated circuits enters the nanometer scale, due to the use of pipeline design and the continuous increase of the operating frequency of the circuit, the single event transient fault pulse caused by the impact of high-energy particles on the circuit is less and less affected by electrical shielding and time window shielding. Logic shielding effect occupies a dominant position among many factors affecting fault propagation. Based on this, the present invention is proposed. The invention establishes a fault model according to the actual situation, and performs fault location on a single particle and double faults. There are three types of double fault locations: the first type, the two fault target gat...

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Abstract

The invention provides a fault simulation method of logic circuit single-particle double-fault. The method comprises the following steps: the first step: executing single-particle double-fault positioning in a target logic circuit so as to search for a target logic gate pair; the second step: determining a type of the searched target logic gate pair; the third step: in allusion to circuit logic ofthe target logic circuit, acquiring normal circuit response in the case that input excitation is applied to the target logic circuit; and the fourth step: in allusion to the target logic circuit, executing double-fault simulation, adding a non-logic gate to the output end of at least one logic gate in the searched target logic gate pair, and acquiring circuit response in the case that the input excitation which is the same as that in the third step is applied to the whole target logic circuit after the non-logic gate is added.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a fault simulation method for single-event double faults in logic circuits. Background technique [0002] A transient fault in a digital integrated circuit (logic circuit) is an instantaneous, recoverable, faulty logic pulse that occurs at random times and locations. There are many environmental factors that cause this transient fault pulse, such as: power supply noise, electromagnetic interference, and radiation of space high-energy particles (alpha particles and neutrons). With the improvement of chip integration, the scale of the circuit continues to increase, and the threshold voltage continues to decrease. The transient failure caused by the impact of high-energy particles on the circuit unit has brought severe challenges to the reliability of the logic circuit. [0003] Generally speaking, the high-energy particle effect that causes a transient fault is called a s...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 蔡烁王伟征余飞邱佳
Owner CHANGSHA UNIVERSITY OF SCIENCE AND TECHNOLOGY
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