An extended finite state machine test data generation method based on variable partition
A finite state machine and test data technology, which is applied in the fields of electrical digital data processing, software testing/debugging, genetic rules, etc., can solve the problems of increasing the probability of multiple backtracking, difficulty in generating effective test data, and increasing time overhead, etc., to achieve Improve generation efficiency, evolutionary algebra, less running time, and high success rate
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[0031] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in combination with specific implementation cases and with reference to the accompanying drawings. The following examples are only used to illustrate the technical solutions of the present invention more clearly, but not to limit the protection scope of the present invention.
[0032] The overall implementation flow chart of the present invention is as figure 1 As shown, the test data generation method includes the following steps:
[0033] Step 1) Convert the software program to be tested into an EFSM model in the computer, and generate a test path candidate set by means of graph traversal.
[0034] Step 2) For the test path candidate set in step 1), preprocess the test path candidate set, use different symbols to represent the variables with the same name in different migration input variable tables, and then...
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