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Defect detecting device and method for non-elevation reflective surface workpieces

A reflective surface and defect detection technology, which is used in measurement devices, optical testing of flaws/defects, and material analysis by optical means. Effect

Pending Publication Date: 2019-04-02
GUILIN UNIV OF ELECTRONIC TECH
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Problems solved by technology

[0004] The object of the present invention is to provide a defect detection device and method for workpieces with non-elevation reflective curved surfaces, so as to solve the problems in the prior art that the defects on the surface of non-elevated reflective curved workpieces cannot be accurately detected in real time.

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  • Defect detecting device and method for non-elevation reflective surface workpieces

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[0024] The specific implementation manner of the present invention will be described in more detail below with reference to schematic diagrams. Advantages and features of the present invention will be apparent from the following description and claims. It should be noted that all the drawings are in a very simplified form and use imprecise scales, and are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention.

[0025] see figure 1 , this embodiment provides a defect detection device for workpieces with non-elevation reflective curved surfaces, including a first optical path a, a second optical path b, a moiré surface light source 1, a semi-transparent and semi-reflective lens 2, an industrial camera 3 and a computer 4. The moiré stripe light beam emitted by the moiré surface light source 1 reaches the half-transparent and half-reflective lens 2 along the first optical path a, and the half-transmittance and half-reflect...

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Abstract

The invention provides a defect detecting device and a method for non-elevation reflective surface workpieces. The device comprises a first light path, a second light path, a moire surface light source, a half transparent and half reflecting mirror, an industrial camera and a computer. A moire fringe beam emitted by the moire surface light source reaches the half transparent and half reflecting mirror along the first optical path. The half transparent and half reflecting mirror reflects the moire fringe beam onto the surface of a non-elevation reflective surface workpiece to form a signal light. The signal light reaches the half transparent and half reflecting mirror along the second light path. The half transparent and half reflecting mirror transmits the signal light to the industrial camera to form a detection image. The computer processes the detection image to determine whether the surface of the non-elevation reflective surface has defects and determines the position of each defect. The invention can accurately detect the defects of the surface of the non-elevation reflective surface workpiece, and solves the problem that the image is supersaturated due to glare during imageacquisition and the detection resolution is uncontrollable.

Description

technical field [0001] The invention relates to the technical field of defect detection, in particular to a defect detection device and method for workpieces with non-elevation reflective curved surfaces. Background technique [0002] In the field of manufacturing, the detection of workpiece surface defects is the key point of automatic detection, especially for polished non-elevation reflective surfaces. Manual inspection is used, and since manual inspection is usually performed under strong light, light, the subjective consciousness of the inspector, and the size of the defect have a greater impact on the inspection quality. Compared with human eye inspection, visual inspection has non-contact measurement, Strict consistency, smaller spatial resolution, higher temporal resolution, and higher work efficiency. Therefore, it is of great significance to design a method that uses machine vision instead of human eyes to detect surface defects of polished workpieces. [0003] U...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
CPCG01N21/8806G01N21/8851G01N2021/8887G01N2021/8874Y02P90/30
Inventor 徐韶华张文涛张丽娟石红强秦祖军王伟
Owner GUILIN UNIV OF ELECTRONIC TECH
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