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Interturn rapid continuous impact test device and method

An impact test and fast technology, applied in the direction of measuring device, testing dielectric strength, measuring electricity, etc., can solve the problems of inability to further improve, low batter frequency, etc., achieve fast charging speed, improve detection rate, and high output power Effect

Active Publication Date: 2019-04-05
青岛艾诺智能仪器有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the inter-turn operation is in the continuous impact mode, due to this serial working mode, each impact test needs to complete each step in turn, which takes 100ms or even longer, resulting in a low combo frequency, which cannot be further improved

Method used

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  • Interturn rapid continuous impact test device and method
  • Interturn rapid continuous impact test device and method
  • Interturn rapid continuous impact test device and method

Examples

Experimental program
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Embodiment Construction

[0037] A rapid continuous impact test device between turns, such as figure 1 As shown, it includes MCU, FPGA, rectification and filtering module, inverter module, boost charging module, and discharge resonance sampling module connected in sequence;

[0038] The rectification and filtering module includes a rectification bridge circuit and a first filter capacitor C1 connected in parallel to its output end, the input end of the rectification bridge circuit is connected to the mains, and the output end is connected to the inverter module through the first filter capacitor C1;

[0039] The inverter module includes a single-phase full-bridge inverter circuit and a second filter capacitor C2 connected in parallel to its output terminal. The single-phase full-bridge inverter circuit is controlled by the MCU through SPWM to generate an AC voltage with adjustable amplitude and frequency , the AC voltage is output to the boost charging module after being passed through the second filte...

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PUM

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Abstract

The invention discloses an interturn rapid continuous impact test device and a method. The device comprises an MCU, an FPGA, and a rectifying and filtering module, an inverter module, a boost chargingmodule and a discharge resonant sampling module which are connected in sequence. The invention aims to simplify an interturn charging, sampling and frequency control circuit in the motor integrated tester, which reduces the cost and improves the reliability. By using a rectified inverter charging method with a larger output power and optimizing a dual-core processed parallel hardware architecture, the time for a single interturn test can be shortened to 50ms or even shorter. As a result, the impact frequency of an interturn continuous test can be improved, and the detection rate of interturnpoor insulation can be improved.

Description

technical field [0001] The invention relates to the field of inter-turn insulation testing of motors, in particular to a device and method for inter-turn rapid and continuous impact testing. Background technique [0002] During motor assembly, improper operations such as winding embedding and shaping may cause damage to the inter-turn insulation of the winding. The various instantaneous overvoltages and operating overvoltages suffered by the motor during operation may cause poor inter-turn insulation of the windings. When the inter-turn insulation of the motor winding is poor, it will cause the winding current to increase and the temperature to rise. If it cannot be found and repaired in time, the motor will have the risk of burning out. [0003] The inter-turn insulation impact test is an effective means to detect poor inter-turn insulation of motor windings and abnormal winding parameters. At present, the inter-turn detection basically adopts the impulse waveform compari...

Claims

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Application Information

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IPC IPC(8): G01R31/12
CPCG01R31/1272
Inventor 范宇李高峰白洪超
Owner 青岛艾诺智能仪器有限公司
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