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Feed circuit structure and test clamp

A technology of feeder circuits and test fixtures, which is applied to components of electrical measuring instruments, measuring instruments, and measuring devices, can solve problems such as low versatility of feeder circuit structures, affect product development cycles, and waste resources, and achieve saving The effect of development cycle, saving production cost, and wide bandwidth

Pending Publication Date: 2019-04-09
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the embodiment of the present invention provides a feeder circuit structure and a test fixture to solve the problem that the feeder circuit structure in the prior art has low versatility, affects the product development cycle, and causes serious waste of resources

Method used

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  • Feed circuit structure and test clamp
  • Feed circuit structure and test clamp
  • Feed circuit structure and test clamp

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0031] Please refer to figure 1 and figure 2 , this embodiment provides a feed circuit structure 100 , including: a feed end 10 , a microwave end 20 and a metal transmission line 30 .

[0032] The feed end 10 is connected to the external DC feed circuit, and the microwave end 20 is connected to the external test fixture CLM; the feed end 10 and the microwave end 20 are arranged at both ends of the metal transmission line 30, and the metal transmission line 30 is arc-shaped.

[0033] Wherein, the length of the metal transmission line 30 is half the circumference of a circle whose diameter is the distance between the feeding end 10 and the microwave end 20 . For details, see figure 2 , L is the distance between the feeding end 10 and the microwave end 20, that is, the diameter of the circle, and the length D of the metal transmission line 30 can pass

[0034] D=(L*π) / 2

[0035] Obtained, is the half circumference of a circle whose diameter is the distance between the feedi...

Embodiment 2

[0051] see image 3 , the present embodiment provides a test fixture, including: including an input fixture 110 and an output fixture 120, and also includes two connected to the input fixture 110 and the output fixture 120, as provided in the first embodiment above any This feed circuit structure 200 also has the beneficial effects of the feed circuit structure 200 in the first embodiment above.

[0052] The microwave end of one feed circuit structure 210 is connected to the microstrip line of the output fixture 110 , and the microwave end of the other feed circuit structure 220 is connected to the microstrip line of the input fixture 120 .

[0053] Optionally, the test fixture further includes: at least one DC feed circuit 300 for supplying power to the output fixture 120 and the input fixture 110 ; the DC feed circuit 300 is connected to the feed end of the feed circuit structure 200 . Exemplarily, the test fixture may include two DC feed circuits 300, the first DC feed cir...

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Abstract

The invention is applicable to the field of microwave power device testing, and provides a feed circuit structure and a test clamp. The circuit structure comprises a feed end, a microwave end and a metal transmission line; the feed end is connected with an external direct-current feed circuit, and the microwave end is connected with the external test clamp; the feed end and the microwave end are arranged at the two ends of the metal transmission line, and the metal transmission line is arc-shaped; and the length of the metal transmission line is the half perimeter of a circle taking the distance between the feed end and the microwave end as the diameter. The feed circuit structure and the test clamp are simple to manufacture, wide in bandwidth, high in universality, wide in test frequencyrange, low in manufacturing cost and short in development period.

Description

technical field [0001] The invention belongs to the field of microwave power device testing, and in particular relates to a feeding circuit structure and a testing fixture. Background technique [0002] The test fixture is an indispensable key component in the microwave power tube device test system. Generally, it needs to realize the functions of fixing the microwave device under test, pre-matching, power feeding, and signal coaxial transmission to microstrip transmission. Its performance directly affects the test the accuracy of the results. In the actual production process of packaged microwave power devices, there are often many types of products to be tested, with different package forms and test conditions. This requires the fixture and power supply circuit to have certain versatility. Otherwise, different products need to be developed for different products. Fixtures and power supply circuits affect the product development cycle and cause serious waste of resources. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04G01R1/02
CPCG01R1/02G01R1/0425
Inventor 李静强曹健胡志富刘亚男冯彬彭志农何美林王亚冰何锐聪
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP