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A multifunctional and efficient dynamic chip verification simulation method and device

A simulation method and multi-functional technology, applied in functional inspection, instrumentation, error detection/correction, etc., can solve problems such as modifying incorrect functions, impossibility, and efficient completion, so as to shorten the return cycle, save time, and improve efficiency Effect

Active Publication Date: 2022-08-09
SPACE STAR TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

With the development of the verification work, design defects will continue to be discovered, which requires designers to modify the current chip design, but modifying the design may cause incorrect modifications or other abnormal functions, so each code modification needs to be modified. Regression validation for all use cases
If this work is carried out artificially, it will be affected by factors such as working hours and manpower efficiency, and cannot be completed most efficiently

Method used

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  • A multifunctional and efficient dynamic chip verification simulation method and device
  • A multifunctional and efficient dynamic chip verification simulation method and device
  • A multifunctional and efficient dynamic chip verification simulation method and device

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Embodiment Construction

[0043] Below will be combined with the attachment to describe multiple embodiments of the present invention.

[0044] figure 1 It is the structural diagram of the multi -functional efficiency and efficient dynamic chip verification simulation system 100 based on the embodiment of the present invention. like figure 1 In the middle, the simulation system or device 100 includes a list of verification use case 102. In one embodiment, the list of authentication is a text file for managing all cases of chip verification, including use case identification, debugging mode switch, coverage switch, and return switch. Verification personnel can select the simulation parameter performed by each verification case by configure this list.

[0045] Further, the simulation system 100 also includes dynamic batch processing regression controller 104, which is the core processing module in the present invention. In one embodiment, the dynamic batch regression controller 104 can be implemented in scr...

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Abstract

The invention discloses a method and device for efficient dynamic chip verification and simulation, which maintains a unified and configurable verification case management list, dynamically adjusts the number of verification case simulation executions through real-time interaction with a server cluster, and completes the dynamic parallel to the maximum extent. Simulation runs for large-scale verification use cases. After the regression is complete, perform a quadratic regression in debug mode for the regression result error case. This method makes full use of the server cluster hardware resources, dynamically adjusts the number of parallel execution verification cases in real time, improves the automation level of verification use case regression, reduces the workload of verification personnel, and shortens the research and development cycle of chip verification work. The efficiency improvement is even more significant.

Description

Technical field [0001] The invention generally involves chip verification simulation technology. More specific, the invention involves a multi -functional high -efficiency dynamic chip verification simulation method and equipment. Background technique [0002] With the increasing complexity of the chip itself and the pressure of project progress that has been existed, how to complete the chip verification work with quality and efficiently is a technical problem that verification personnel need to solve. When the chip design code is stable, the verification engineer design large -scale verification use cases to ensure that the function of the entire chip is correct. As the size of the chip continues to increase, the number of verification use cases has also increased significantly. As the verification work is carried out, design defects will be constantly found. This requires the designer to modify the current chip design, but the modification design may have incorrect modificatio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/26
CPCG06F11/261
Inventor 成丹马盼张少真齐丹李宾张晋升刘学毅孟勇王文斌马效波贾琳姗
Owner SPACE STAR TECH CO LTD
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