Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A multifunctional high-efficiency dynamic chip verification simulation method and device

A simulation method and multi-functional technology, applied in functional inspection, instrumentation, error detection/correction, etc., can solve problems such as efficient completion, impossibility, and incorrect function modification, so as to improve efficiency, flexible verification methods, and shorten regression cycle effect

Active Publication Date: 2019-04-09
SPACE STAR TECH CO LTD
View PDF9 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

With the development of the verification work, design defects will continue to be discovered, which requires designers to modify the current chip design, but modifying the design may cause incorrect modifications or other abnormal functions, so each code modification needs to be modified. Regression validation for all use cases
If this work is carried out artificially, it will be affected by factors such as working hours and manpower efficiency, and cannot be completed most efficiently

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A multifunctional high-efficiency dynamic chip verification simulation method and device
  • A multifunctional high-efficiency dynamic chip verification simulation method and device
  • A multifunctional high-efficiency dynamic chip verification simulation method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0043] A number of embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0044] figure 1 It is a structural diagram of a multifunctional and efficient dynamic chip verification simulation system 100 according to an embodiment of the present invention. Such as figure 1 As shown in , the simulated system or device 100 includes a verification use case list 102 . In one embodiment, the verification use case list is a text file for managing all chip verification use cases, including simulation options such as use case identification, debugging mode switch, coverage rate switch, and regression switch. Verifiers can configure this list to select the simulation parameters to be executed for each verification case.

[0045] Further, the simulation system 100 also includes a dynamic batch regression controller 104, which is the core processing module in the present invention. In one embodiment, the dynamic batch regre...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a multifunctional high-efficiency dynamic chip verification simulation method and device, which maintain a unified and configurable verification case management list, dynamically adjust the simulation execution quantity of verification cases through real-time interaction with a server cluster, and dynamically complete simulation operation of large-scale verification cases to the maximum extent in parallel. And after the regression is completed, secondary regression of the debugging mode is carried out on a regression result error use case. According to the method, hardware resources of the server cluster are fully utilized, the number of verification cases which are executed in parallel is dynamically adjusted in real time, the automation level of regression of theverification cases is improved, the workload of verification personnel is reduced, the research and development period of chip verification work is shortened, and the efficiency is more remarkably improved for the application condition of a multi-project shared server cluster.

Description

technical field [0001] The present invention generally relates to the technical field of chip verification simulation. More specifically, the present invention relates to a multifunctional and efficient dynamic chip verification simulation method and device. Background technique [0002] With the increasing complexity of the chip itself and the ever-existing project schedule pressure, how to complete the chip verification work with high quality and efficiency is a technical problem that verification personnel need to solve. When the chip design code is stable, verification engineers design large-scale verification use cases to ensure the correct function of the entire chip. As the chip size continues to increase, the number of verification use cases has also increased significantly. With the development of the verification work, design defects will continue to be discovered, which requires the designer to modify the current chip design, but the modification of the design m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/26
CPCG06F11/261
Inventor 成丹马盼张少真齐丹李宾张晋升刘学毅孟勇王文斌马效波贾琳姗
Owner SPACE STAR TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products