Comparison circuit and delay time elimination method
A technology for comparing circuits and circuits, applied in the field of circuits, can solve the problems of response delay causing errors in comparison results and inherent errors in comparison circuits, and achieve the effect of eliminating inherent delays
Active Publication Date: 2019-04-16
WUXI CHIPOWN MICROELECTRONICS
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Problems solved by technology
However, due to the existence of inherent delay (usually tens of nanoseconds), there is always a certain inherent error in the comparison circuit
[0004] Therefore, the inherent response delay of the existing comparison circuit causes errors in the comparison results
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[0026] In the prior art, there is always a certain inherent delay in the comparison circuit, which leads to errors in the comparison results. For example, if figure 1 As shown, in the rising process of the input signal VIN, when the input signal VIN is equal to the reference voltage VREF, VOUT should immediately flip to high level at time A, but due to the inherent delay of the comparator, when VOUT flips at time B When it is at a high level, the voltage of the input signal VIN is not equal to the reference voltage VREF at this time, thus causing an error.
[0027] The comparison circuit provided by the embodiment of the present invention works jointly through the control circuit, the capacitor circuit and the transconductance amplifier circuit to control the comparison circuit in different working stages. The shift can make the comparison circuit output the comparison result earlier in the process of signal comparison, so as to effectively eliminate the inherent delay of the...
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The invention discloses a comparison circuit and a delay time elimination method. The comparison circuit includes a control circuit, a capacitance circuit and a transconductance amplifier circuit. Thecontrol circuit is suitable for receiving an input signal, controlling the comparison circuit to be at different work stages on the basis of the input signal and an output signal of the comparison circuit. The capacitance circuit is suitable for storing a direct-current maladjustment voltage signal at an automatic zero calibration stage; storing the input signal at a moment of output signal flipping at a measurement stage, and storing an equivalent delay time voltage signal at a delay time sampling stage. The transconductance amplifier circuit is suitable for storing the direct-current maladjustment voltage signal to the capacitance circuit at the automatic zero calibration stage; at the measurement stage, comparing voltage signals at positive and negative input ends, and generating the output signal of the comparison circuit; and storing the equivalent delay time voltage signal to the capacitance circuit at the delay time sampling stage. By applying the above comparison circuit, inherent delay time of the comparison circuit can be eliminated.
Description
technical field [0001] The embodiments of the present invention relate to the field of circuits, and in particular, to a comparison circuit and a delay elimination method. Background technique [0002] In the field of circuits, comparison circuits are widely used. The basic principle of the comparison circuit is to compare and judge the input signal and the reference voltage in real time, quickly and accurately, and output the judgment result for other circuits to process. For example, once the input signal changes from being lower than the reference voltage to being higher than the reference voltage, or from being higher than the reference voltage to being lower than the reference voltage, the judgment result is immediately output to the subsequent circuit for processing. [0003] In the prior art, by continuously improving the structure and device parameters of the comparison circuit, the comparison circuit can quickly and accurately output the comparison result. However...
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IPC IPC(8): H03K5/22
CPCH03K5/22H03K3/02337H03K5/1565
Inventor 王雷一邹宇彤张立新
Owner WUXI CHIPOWN MICROELECTRONICS