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Chip packaging method and chip packaging structure

A chip packaging structure and chip packaging technology, applied in semiconductor/solid-state device parts, semiconductor devices, electrical components, etc., can solve problems such as chip peeling and affecting the performance of the packaging structure, so as to improve delamination and avoid mismatching of thermal expansion coefficients , the effect of improving performance

Active Publication Date: 2020-09-29
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

CoW packaging technology has many advantages, such as the ability to achieve high integration of semiconductor devices, reduce the size of semiconductor packages, reduce the cost of final products, simplify the assembly process and improve yield, etc. After the level injection molding step is completed, problems of wafer warpage and stress-induced delamination are often encountered, which easily lead to the peeling of the stacked wafers from the component wafers, seriously affecting the performance of the packaging structure

Method used

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  • Chip packaging method and chip packaging structure
  • Chip packaging method and chip packaging structure
  • Chip packaging method and chip packaging structure

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Embodiment Construction

[0033] Please refer to Figure 1A with Figure 1B , in a CoW packaging technology, the element wafer 10 is defined by a scribe line to define a plurality of wafer areas, these wafer areas include bad wafer areas (ugly die) and good wafer areas 12 that can be used for stacking wafers, each A good wafer area 12 is usually provided with a plurality of reserved positions for stacking wafers 13. After the wafers 13 are stacked on the reserved positions of each good wafer area 12, wafer level molding (wafer level molding) will be used. The process forms a plastic encapsulation layer 14 on the entire component wafer 10 and the surfaces of all chips 13 to seal the chips 13 inside. At present, the material of the plastic encapsulation layer 14 is mainly 70ppm / K epoxy resin, which has a high coefficient of thermal expansion (CTE), and there is a large CTE mismatch problem with the component wafer 10, which causes the component wafer The warpage of the circle 10 and the delamination cau...

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Abstract

The invention provides a chip packaging method and a chip packaging structure. A thermal expansion coefficient transition layer with a relatively low thermal expansion coefficient is formed on the component wafer and exposed to the surface of the reserved position for chip stacking, which can avoid the impact of the encapsulation layer on the component wafer. The wafer on the circle and the thermal expansion coefficient transition layer encapsulation cause a large thermal expansion coefficient mismatch, which can improve the wafer warpage and stress-induced delamination problems, and avoid stacked wafers and encapsulation layers from components Wafer is peeled off to improve the performance of the packaging structure; further, the thermal expansion coefficient transition layer is formed of a solder resist material for a printed circuit board, which is easy to implement, does not produce side effects, and can enhance the adhesion with the subsequent encapsulation layer. Adhesion, to avoid the encapsulation layer from peeling off the surface of the component wafer.

Description

technical field [0001] The invention relates to the technical field of integrated circuit manufacturing, in particular to a chip packaging method and a chip packaging structure. Background technique [0002] Chip on wafer (CoW) packaging technology, as one of the advanced packaging (Package) technologies, can stack multiple different The size of the wafer (Die, that is, a block with complete functions cut out from the wafer) to meet different functions, and then realize the manufacture of three-dimensional semiconductor integrated circuit (IC) products. CoW packaging technology has many advantages, such as the ability to achieve high integration of semiconductor devices, reduce the size of semiconductor packages, reduce the cost of final products, simplify assembly processes, and improve yields. After the level injection molding step is completed, problems of wafer warpage and stress-induced delamination are often encountered, which easily cause the stacked chips to peel of...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/56H01L23/31H01L23/488H01L21/60
CPCH01L24/32H01L24/83H01L21/563H01L23/3171H01L2224/32148H01L2224/32146H01L2224/83007H01L2924/3511H01L2924/35121H01L2224/16145H01L2224/94H01L2224/81
Inventor 陈彧
Owner SEMICON MFG INT (SHANGHAI) CORP